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中国物理学会期刊
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Zhang Meng, Yao Ruo-He, Liu Yu-Rong, Geng Kui-Wei. Shot noise model of the short channel metal-oxide-semiconductor field-effect transistorJ. Acta Physica Sinica, 2020, 69(17): 177102. DOI: 10.7498/aps.69.20200497
Citation: Zhang Meng, Yao Ruo-He, Liu Yu-Rong, Geng Kui-Wei. Shot noise model of the short channel metal-oxide-semiconductor field-effect transistorJ. Acta Physica Sinica, 2020, 69(17): 177102. DOI: 10.7498/aps.69.20200497
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Shot noise model of the short channel metal-oxide-semiconductor field-effect transistor

Acta Phys. Sin., 2020, 69(17): 177102.
DOI: 10.7498/aps.69.20200497
CSTR: 32037.14.aps.69.20200497
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