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Zhang Xing-Yu. Effects of current density on fracture behaviors for micron-sized crystalline silicon electrodesJ. Acta Physica Sinica, 2020, 69(24): 248201. DOI: 10.7498/aps.69.20200915
Citation: Zhang Xing-Yu. Effects of current density on fracture behaviors for micron-sized crystalline silicon electrodesJ. Acta Physica Sinica, 2020, 69(24): 248201. DOI: 10.7498/aps.69.20200915
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Effects of current density on fracture behaviors for micron-sized crystalline silicon electrodes

Acta Phys. Sin., 2020, 69(24): 248201.
DOI: 10.7498/aps.69.20200915
CSTR: 32037.14.aps.69.20200915
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