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中国物理学会期刊
Li Ya-Sha, Liu Shi-Chong, Liu Qing-Dong, Xia Yu, Hu Huo-Ran, Li Guang-Zhu. Electrical properties of ZnO/\boldsymbol\beta -Bi2O3 interfaces featuring aggregation defect under external electric fieldsJ. Acta Physica Sinica, 2022, 71(2): 026801. DOI: 10.7498/aps.71.20210635
Citation: Li Ya-Sha, Liu Shi-Chong, Liu Qing-Dong, Xia Yu, Hu Huo-Ran, Li Guang-Zhu. Electrical properties of ZnO/\boldsymbol\beta -Bi2O3 interfaces featuring aggregation defect under external electric fieldsJ. Acta Physica Sinica, 2022, 71(2): 026801. DOI: 10.7498/aps.71.20210635

Electrical properties of ZnO/\boldsymbol\beta -Bi2O3 interfaces featuring aggregation defect under external electric fields

CSTR: 32037.14.aps.71.20210635
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