Li Ya-Sha, Liu Shi-Chong, Liu Qing-Dong, Xia Yu, Hu Huo-Ran, Li Guang-Zhu. Electrical properties of ZnO/\boldsymbol\beta -Bi2O3 interfaces featuring aggregation defect under external electric fieldsJ. Acta Physica Sinica, 2022, 71(2): 026801. DOI: 10.7498/aps.71.20210635
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Citation:
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Li Ya-Sha, Liu Shi-Chong, Liu Qing-Dong, Xia Yu, Hu Huo-Ran, Li Guang-Zhu. Electrical properties of ZnO/\boldsymbol\beta -Bi2O3 interfaces featuring aggregation defect under external electric fieldsJ. Acta Physica Sinica, 2022, 71(2): 026801. DOI: 10.7498/aps.71.20210635
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Li Ya-Sha, Liu Shi-Chong, Liu Qing-Dong, Xia Yu, Hu Huo-Ran, Li Guang-Zhu. Electrical properties of ZnO/\boldsymbol\beta -Bi2O3 interfaces featuring aggregation defect under external electric fieldsJ. Acta Physica Sinica, 2022, 71(2): 026801. DOI: 10.7498/aps.71.20210635
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Citation:
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Li Ya-Sha, Liu Shi-Chong, Liu Qing-Dong, Xia Yu, Hu Huo-Ran, Li Guang-Zhu. Electrical properties of ZnO/\boldsymbol\beta -Bi2O3 interfaces featuring aggregation defect under external electric fieldsJ. Acta Physica Sinica, 2022, 71(2): 026801. DOI: 10.7498/aps.71.20210635
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