Wavelet transform based method of measuring multi-frequency electrostatic force microscopy dynamic process

Wang Jian-Hai; Qian Jian-Qiang; Dou Zhi-Peng; Lin Rui; Xu Ze-Yu; Cheng Peng; Wang Cheng; Li Lei; Li Ying-Zi

doi:10.7498/aps.71.20212095

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Wang Jian-Hai, Qian Jian-Qiang, Dou Zhi-Peng, Lin Rui, Xu Ze-Yu, Cheng Peng, Wang Cheng, Li Lei, Li Ying-Zi. Wavelet transform based method of measuring multi-frequency electrostatic force microscopy dynamic processJ. Acta Physica Sinica, 2022, 71(9): 096801. DOI: 10.7498/aps.71.20212095

Citation:

Wang Jian-Hai, Qian Jian-Qiang, Dou Zhi-Peng, Lin Rui, Xu Ze-Yu, Cheng Peng, Wang Cheng, Li Lei, Li Ying-Zi. Wavelet transform based method of measuring multi-frequency electrostatic force microscopy dynamic processJ. Acta Physica Sinica, 2022, 71(9): 096801. DOI: 10.7498/aps.71.20212095

Citation:

Wang Jian-Hai, Qian Jian-Qiang, Dou Zhi-Peng, Lin Rui, Xu Ze-Yu, Cheng Peng, Wang Cheng, Li Lei, Li Ying-Zi. Wavelet transform based method of measuring multi-frequency electrostatic force microscopy dynamic processJ. Acta Physica Sinica, 2022, 71(9): 096801. DOI: 10.7498/aps.71.20212095