Peng Chao, Lei Zhi-Feng, Zhang Zhan-Gang, He Yu-Juan, Chen Yi-Qiang, Lu Guo-Guang, Huang Yun. Damage mechanism of SiC Schottky barrier diode irradiated by heavy ionsJ. Acta Physica Sinica, 2022, 71(17): 176101. DOI: 10.7498/aps.71.20220628
|
Citation:
|
Peng Chao, Lei Zhi-Feng, Zhang Zhan-Gang, He Yu-Juan, Chen Yi-Qiang, Lu Guo-Guang, Huang Yun. Damage mechanism of SiC Schottky barrier diode irradiated by heavy ionsJ. Acta Physica Sinica, 2022, 71(17): 176101. DOI: 10.7498/aps.71.20220628
|
Peng Chao, Lei Zhi-Feng, Zhang Zhan-Gang, He Yu-Juan, Chen Yi-Qiang, Lu Guo-Guang, Huang Yun. Damage mechanism of SiC Schottky barrier diode irradiated by heavy ionsJ. Acta Physica Sinica, 2022, 71(17): 176101. DOI: 10.7498/aps.71.20220628
|
Citation:
|
Peng Chao, Lei Zhi-Feng, Zhang Zhan-Gang, He Yu-Juan, Chen Yi-Qiang, Lu Guo-Guang, Huang Yun. Damage mechanism of SiC Schottky barrier diode irradiated by heavy ionsJ. Acta Physica Sinica, 2022, 71(17): 176101. DOI: 10.7498/aps.71.20220628
|