In situ study of light emission from SiO2 irradiated by 645 MeV Xe35+ ions

Xu Qiu-Mei; Gou Jie; Zhang Chong-Hong; Yang Zhi-Hu; Wang Yan-Yu; Han Xu-Xiao; Li Jian-Yang

doi:10.7498/aps.72.20221952

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Xu Qiu-Mei, Gou Jie, Zhang Chong-Hong, Yang Zhi-Hu, Wang Yan-Yu, Han Xu-Xiao, Li Jian-Yang. In situ study of light emission from SiO2 irradiated by 645 MeV Xe35+ ionsJ. Acta Physica Sinica, 2023, 72(4): 043402. DOI: 10.7498/aps.72.20221952

Citation:

Xu Qiu-Mei, Gou Jie, Zhang Chong-Hong, Yang Zhi-Hu, Wang Yan-Yu, Han Xu-Xiao, Li Jian-Yang. In situ study of light emission from SiO2 irradiated by 645 MeV Xe35+ ionsJ. Acta Physica Sinica, 2023, 72(4): 043402. DOI: 10.7498/aps.72.20221952

Citation:

Xu Qiu-Mei, Gou Jie, Zhang Chong-Hong, Yang Zhi-Hu, Wang Yan-Yu, Han Xu-Xiao, Li Jian-Yang. In situ study of light emission from SiO2 irradiated by 645 MeV Xe35+ ionsJ. Acta Physica Sinica, 2023, 72(4): 043402. DOI: 10.7498/aps.72.20221952