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Zhang Xing, Liu Yu-Lin, Li Gang, Yan Shao-An, Xiao Yong-Guang, Tang Ming-Hua. Erratum: Three-dimensional numerical simulation of single event upset effect based on 55 nm DICE latch unitActa Phys. Sin. 2024, 73(6): 066103J. Acta Physica Sinica, 2024, 73(7): 079901. DOI: 10.7498/aps.73.079901
Citation: Zhang Xing, Liu Yu-Lin, Li Gang, Yan Shao-An, Xiao Yong-Guang, Tang Ming-Hua. Erratum: Three-dimensional numerical simulation of single event upset effect based on 55 nm DICE latch unitActa Phys. Sin. 2024, 73(6): 066103J. Acta Physica Sinica, 2024, 73(7): 079901. DOI: 10.7498/aps.73.079901
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Erratum: Three-dimensional numerical simulation of single event upset effect based on 55 nm DICE latch unitActa Phys. Sin. 2024, 73(6): 066103

Acta Phys. Sin., 2024, 73(7): 079901.
DOI: 10.7498/aps.73.079901
CSTR: 32037.14.aps.73.079901
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  • Abstract

    Original Article

    Three-dimensional numerical simulation of single event upset effect based on 55 nm DICE latch unit

    Zhang Xing, Liu Yu-Lin, Li Gang, Yan Shao-An, Xiao Yong-Guang, Tang Ming-Hua. Three-dimensional numerical simulation of single event upset effect based on 55 nm DICE latch unit. [Acta Phys. Sin. 2024, 73(6): 066103]. doi: 10.7498/aps.73.20231564

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