Influence of thickness and doping-dependent properties of Li-doped NiO thin films on rectification effect of pn junction

WANG Lei; ZHOU Tong; HUA Enda; LIU Zhongliang; LI Bing; LIU Qinzhuang

doi:10.7498/aps.74.20241683

Search

x

WANG Lei, ZHOU Tong, HUA Enda, LIU Zhongliang, LI Bing, LIU Qinzhuang. Influence of thickness and doping-dependent properties of Li-doped NiO thin films on rectification effect of pn junctionJ. Acta Physica Sinica, 2025, 74(9): 096802. DOI: 10.7498/aps.74.20241683

Citation:

WANG Lei, ZHOU Tong, HUA Enda, LIU Zhongliang, LI Bing, LIU Qinzhuang. Influence of thickness and doping-dependent properties of Li-doped NiO thin films on rectification effect of pn junctionJ. Acta Physica Sinica, 2025, 74(9): 096802. DOI: 10.7498/aps.74.20241683

Citation:

WANG Lei, ZHOU Tong, HUA Enda, LIU Zhongliang, LI Bing, LIU Qinzhuang. Influence of thickness and doping-dependent properties of Li-doped NiO thin films on rectification effect of pn junctionJ. Acta Physica Sinica, 2025, 74(9): 096802. DOI: 10.7498/aps.74.20241683