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中国物理学会期刊
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LONG Mingbing, ZHU Xiang, LI Hongwei, ZHAO Xu, ZHANG Wanying, TAO Mengze, HAN Jianwei. Simulation analysis of effectiveness of deep dielectric charging in ground testsJ. Acta Physica Sinica, 2025, 74(13): 137201. DOI: 10.7498/aps.74.20250248
Citation: LONG Mingbing, ZHU Xiang, LI Hongwei, ZHAO Xu, ZHANG Wanying, TAO Mengze, HAN Jianwei. Simulation analysis of effectiveness of deep dielectric charging in ground testsJ. Acta Physica Sinica, 2025, 74(13): 137201. DOI: 10.7498/aps.74.20250248
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Simulation analysis of effectiveness of deep dielectric charging in ground tests

Acta Phys. Sin., 2025, 74(13): 137201.
DOI: 10.7498/aps.74.20250248
CSTR: 32037.14.aps.74.20250248
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