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中国物理学会期刊
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WANG Ziyu, LIANG Yanan, CHEN Rui, HAN Jianwei, YU Hailong. Mechanism of step current evolution in single event burnout of GaN high-electron-mobility transistorsJ. Acta Physica Sinica, 2026, 75(11): 110807. DOI: 10.7498/aps.75.20260122
Citation: WANG Ziyu, LIANG Yanan, CHEN Rui, HAN Jianwei, YU Hailong. Mechanism of step current evolution in single event burnout of GaN high-electron-mobility transistorsJ. Acta Physica Sinica, 2026, 75(11): 110807. DOI: 10.7498/aps.75.20260122
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Mechanism of step current evolution in single event burnout of GaN high-electron-mobility transistors

Acta Phys. Sin., 2026, 75(11): 110807.
DOI: 10.7498/aps.75.20260122
CSTR: 32037.14.aps.75.20260122
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