A review of ultrafast electron microscopy characterization techniques

LIU Fang; DENG Ying; LIU Jingchao; CHEN Lenan; JI Shaozheng; LIU Chuanpu; CHEN Xiang; FU Xuewen

doi:10.7498/aps.75.20260292

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中国物理学会期刊

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LIU Fang, DENG Ying, LIU Jingchao, CHEN Lenan, JI Shaozheng, LIU Chuanpu, CHEN Xiang, FU Xuewen. A review of ultrafast electron microscopy characterization techniques. Acta Physica Sinica, 2026, 75(15): 150701. DOI: 10.7498/aps.75.20260292

Citation:

LIU Fang, DENG Ying, LIU Jingchao, CHEN Lenan, JI Shaozheng, LIU Chuanpu, CHEN Xiang, FU Xuewen. A review of ultrafast electron microscopy characterization techniques. Acta Physica Sinica, 2026, 75(15): 150701. DOI: 10.7498/aps.75.20260292

Citation:

LIU Fang, DENG Ying, LIU Jingchao, CHEN Lenan, JI Shaozheng, LIU Chuanpu, CHEN Xiang, FU Xuewen. A review of ultrafast electron microscopy characterization techniques. Acta Physica Sinica, 2026, 75(15): 150701. DOI: 10.7498/aps.75.20260292