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Zhu Meng-Long, Yang Jun, Dong Yu-Lan, Zhou Yuan, Shao Yan, Hou Hai-Liang, Chen Zhi-Hui, He Jun. Atomic and electronic structure of monolayer ferroelectric GeS on Cu(111). Acta Physica Sinica,
2024, 73(1): 010701.
doi: 10.7498/aps.73.20231246
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Xu Si-Wei, Wang Xun-Si, Shen Xiang. Structure of GexGa8S92–x glasses studied by high-resolution X-ray photoelectron spectroscopy and Raman scattering. Acta Physica Sinica,
2023, 72(1): 017101.
doi: 10.7498/aps.72.20221653
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Meng Jing-Yi, Lu Hong-Wei, Ma Shi-Le, Zhang Jia-Qi, He Fu-Min, Su Wei-Tao, Zhao Xiao-Dong, Tian Ting, Wang Yi, Xing Yu. Progress of application of functional atomic force microscopy in study of nanodielectric material properties. Acta Physica Sinica,
2022, 71(24): 240701.
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Yang Meng-Sheng, Yi Tai-Min, Zheng Feng-Cheng, Tang Yong-Jian, Zhang Lin, Du Kai, Li Ning, Zhao Li-Ping, Ke Bo, Xing Pi-Feng. Surface oxidation of as-deposit uranium film characterized by X-ray photoelectron spectroscopy. Acta Physica Sinica,
2018, 67(2): 027301.
doi: 10.7498/aps.67.20172055
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Zhou Hao-Tian, Gao Xiang, Zheng Peng, Qin Meng, Cao Yi, Wang Wei. Mechanical properties of elastomeric proteins studied by single molecule force spectroscopy. Acta Physica Sinica,
2016, 65(18): 188703.
doi: 10.7498/aps.65.188703
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Xu Si-Wei, Wang Li, Shen Xiang. Raman scattering and X-ray photoelectron spectra of GexSb20Se80-x Glasses. Acta Physica Sinica,
2015, 64(22): 223302.
doi: 10.7498/aps.64.223302
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Xue Hui, Ma Zong-Min, Shi Yun-Bo, Tang Jun, Xue Chen-Yang, Liu Jun, Li Yan-Jun. Magnetic exchange force microscopy using ferromagnetic resonance. Acta Physica Sinica,
2013, 62(18): 180704.
doi: 10.7498/aps.62.180704
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Ji Chao, Zhang Ling-Yun, Dou Shuo-Xing, Wang Peng-Ye. A new method to deal with biomacromolecularimage observed by atomic force microscopy. Acta Physica Sinica,
2011, 60(9): 098703.
doi: 10.7498/aps.60.098703
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Zou Ji-Jun, Zhang Yi-Jun, Yang Zhi, Chang Ben-Kang. Degradation model of GaAs vacuum electron sources. Acta Physica Sinica,
2011, 60(1): 017902.
doi: 10.7498/aps.60.017902
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Zhang Wang, Xu Fa-Qiang, Wang Guo-Dong, Zhang Wen-Hua, Li Zong-Mu, Wang Li-Wu, Chen Tie-Xin. Thickness dependence of the interfacial interaction for the Fe/ZnO (0001) system studied by photoemission. Acta Physica Sinica,
2011, 60(1): 017104.
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Han Lu-Hui, Zhang Chong-Hong, Zhang Li-Qing, Yang Yi-Tao, Song Yin, Sun You-Mei. X-ray photoelectron spectroscopy study on GaN crystal irradiated by slow highly charged ions. Acta Physica Sinica,
2010, 59(7): 4584-4590.
doi: 10.7498/aps.59.4584
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Li Yong-Hua, Liu Chang-Sheng, Meng Fan-Ling, Wang Yu-Ming, Zheng Wei-Tao. X-ray photoelectron spectroscopy analysis of the effect of thickness on the transformation temperature of NiTi alloy thin films. Acta Physica Sinica,
2009, 58(4): 2742-2745.
doi: 10.7498/aps.58.2742
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Fan Kang-Qi, Jia Jian-Yuan, Zhu Ying-Min, Liu Xiao-Yuan. Dynamic model of atomic force microscopy in tapping-mode. Acta Physica Sinica,
2007, 56(11): 6345-6351.
doi: 10.7498/aps.56.6345
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Hu Hai-Long, Zhang Kun, Wang Zhen-Xing, Wang Xiao-Ping. Study of the transport properties of self-assembled alkanethiol monolayer by conduction atomic force microscopy. Acta Physica Sinica,
2006, 55(3): 1430-1434.
doi: 10.7498/aps.55.1430
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Wang Xiao-Xiong, Li Hong-Nian. Core-level photoemission of Sm fullerides. Acta Physica Sinica,
2006, 55(8): 4259-4264.
doi: 10.7498/aps.55.4259
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Feng Yu-Qing, Zhao Kun, Zhu Tao, Zhan Wen-Shan. Thermal stability of magnetic tunnel junctions investigated by x-ray photoelectron spectroscopy. Acta Physica Sinica,
2005, 54(11): 5372-5376.
doi: 10.7498/aps.54.5372
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Zhang Xiang-Jun, Meng Yong-Gang, Wen Shi-Zhu. On micro scanning forces under the coupling deformation of atomic force microscope probe. Acta Physica Sinica,
2004, 53(3): 728-733.
doi: 10.7498/aps.53.728
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Sun Run-Guang, Qi Hao, Zhang Jing. . Acta Physica Sinica,
2002, 51(6): 1203-1207.
doi: 10.7498/aps.51.1203
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LI LIU-HE, ZHANG HAI-QUAN, CUI XU-MING, ZHANG YAN-HUA, XIA LI-FANG, MA XIN-XIN, SUN YUE. COMPARATIVE ANALYSIS OF DLC FLIM FINE STRUCTURE BY RAMAN SPECTRA AND X-RAY PHOTOELECTRON SPECTROSCOPY. Acta Physica Sinica,
2001, 50(8): 1549-1554.
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YUAN JIN-SHE, CHEN GUANG-DE, QI MING, LI AI-ZHEN, XU ZHUO. XPS AND AES INVESTIGATION OF GaN FILMS GROWN BY MBE. Acta Physica Sinica,
2001, 50(12): 2429-2433.
doi: 10.7498/aps.50.2429
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