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Xu Si-Wei, Wang Xun-Si, Shen Xiang. Structure of GexGa8S92–x glasses studied by high-resolution X-ray photoelectron spectroscopy and Raman scattering. Acta Physica Sinica,
2023, 72(1): 017101.
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Zhang Guan-Jie, Yang Hao, Zhang Nan. Research progress of the investigation of intrinsic and extrinsic origin of piezoelectric materials by X-ray diffraction. Acta Physica Sinica,
2020, 69(12): 127711.
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Huang Hao, Zhang Kan, Wu Ming, Li Hu, Wang Min-Juan, Zhang Shu-Ming, Chen Jian-Hong, Wen Mao. Comparison between axial residual stresses measured by Raman spectroscopy and X-ray diffraction in SiC fiber reinforced titanium matrix composite. Acta Physica Sinica,
2018, 67(19): 197203.
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Yang Meng-Sheng, Yi Tai-Min, Zheng Feng-Cheng, Tang Yong-Jian, Zhang Lin, Du Kai, Li Ning, Zhao Li-Ping, Ke Bo, Xing Pi-Feng. Surface oxidation of as-deposit uranium film characterized by X-ray photoelectron spectroscopy. Acta Physica Sinica,
2018, 67(2): 027301.
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Xu Si-Wei, Wang Li, Shen Xiang. Raman scattering and X-ray photoelectron spectra of GexSb20Se80-x Glasses. Acta Physica Sinica,
2015, 64(22): 223302.
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Pan Hui-Ping, Cheng Feng-Feng, Li Lin, Horng Ray-Hua, Yao Shu-De. Structrual analyses of Ga2+xO3-x thin films grown on sapphire substrates. Acta Physica Sinica,
2013, 62(4): 048801.
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Li Jia, Fang Qi, Luo Bing-Chi, Zhou Min-Jie, Li Kai, Wu Wei-Dong. Residual stress analysis by grazing-incidence X-ray diffraction on beryllium films. Acta Physica Sinica,
2013, 62(14): 140701.
doi: 10.7498/aps.62.140701
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Zhang Wang, Xu Fa-Qiang, Wang Guo-Dong, Zhang Wen-Hua, Li Zong-Mu, Wang Li-Wu, Chen Tie-Xin. Thickness dependence of the interfacial interaction for the Fe/ZnO (0001) system studied by photoemission. Acta Physica Sinica,
2011, 60(1): 017104.
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Zhang Shan-Li, Zeng Fan-Ming, Wang Xin-Tong, Li Chun, Wang Cheng-Wei, Zhang Ying, Lin Hai, Qin Jie-Ming, Liu Jing-He. Growth and structure characterization of Cr4+ doped Ca2GeO4 laser crystal. Acta Physica Sinica,
2010, 59(10): 7214-7218.
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Han Lu-Hui, Zhang Chong-Hong, Zhang Li-Qing, Yang Yi-Tao, Song Yin, Sun You-Mei. X-ray photoelectron spectroscopy study on GaN crystal irradiated by slow highly charged ions. Acta Physica Sinica,
2010, 59(7): 4584-4590.
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Li Yong-Hua, Liu Chang-Sheng, Meng Fan-Ling, Wang Yu-Ming, Zheng Wei-Tao. X-ray photoelectron spectroscopy analysis of the effect of thickness on the transformation temperature of NiTi alloy thin films. Acta Physica Sinica,
2009, 58(4): 2742-2745.
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Ming Bao-Quan, Wang Jin-Feng, Zang Guo-Zhong, Wang Chun-Ming, Gai Zhi-Gang, Du Juan, Zheng Li-Mei. X-ray diffraction and phase transition analysis for (K, Na)NbO3-based lead-free piezoelectric ceramics. Acta Physica Sinica,
2008, 57(9): 5962-5967.
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Li Hong-Tao, Luo Yi, Xi Guang-Yi, Wang Lai, Jiang Yang, Zhao Wei, Han Yan-Jun, Hao Zhi-Biao, Sun Chang-Zheng. Thickness measurement of GaN films by X-ray diffraction. Acta Physica Sinica,
2008, 57(11): 7119-7125.
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Tan Guo-Tai, Chen Zheng-Hao. XRD analysis on lattice structure of La1-xTexMnO3. Acta Physica Sinica,
2007, 56(3): 1702-1706.
doi: 10.7498/aps.56.1702
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Qin Pei, Lou Yu-Wan, Yang Chuan-Zheng, Xia Bao-Jia. New computing methods and programs for separating multipe-broadening effects of X-ray diffraction lines. Acta Physica Sinica,
2006, 55(3): 1325-1335.
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Ou Gu-Ping, Song Zhen, Gui Wen-Ming, Zhang Fu-Jia. Surface analysis of LiBq4/ITO and LiBq4/CuPc/ITO using atomic force microscopy and x-ray photoelectron spectroscopy. Acta Physica Sinica,
2005, 54(12): 5717-5722.
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Feng Yu-Qing, Zhao Kun, Zhu Tao, Zhan Wen-Shan. Thermal stability of magnetic tunnel junctions investigated by x-ray photoelectron spectroscopy. Acta Physica Sinica,
2005, 54(11): 5372-5376.
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Du Xiao-Song, S. Hak, O. C. Rogojanu, T. Hibma. X-ray study of chromium oxide films epitaxially grown on MgO. Acta Physica Sinica,
2004, 53(10): 3510-3514.
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LI LIU-HE, ZHANG HAI-QUAN, CUI XU-MING, ZHANG YAN-HUA, XIA LI-FANG, MA XIN-XIN, SUN YUE. COMPARATIVE ANALYSIS OF DLC FLIM FINE STRUCTURE BY RAMAN SPECTRA AND X-RAY PHOTOELECTRON SPECTROSCOPY. Acta Physica Sinica,
2001, 50(8): 1549-1554.
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YUAN JIN-SHE, CHEN GUANG-DE, QI MING, LI AI-ZHEN, XU ZHUO. XPS AND AES INVESTIGATION OF GaN FILMS GROWN BY MBE. Acta Physica Sinica,
2001, 50(12): 2429-2433.
doi: 10.7498/aps.50.2429
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