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The particle-in-cell (PIC) simulation method is used to get the reliable ionization parameters of high power microwave flashover and breakdown on dielectric surface for fluid modeling. Firstly, the PIC method is presented briefly, including dynamic equations, secondary emission and Monte-Carlo collision (MCC) between electron and gas atom. Secondary, the fluid global model (GM) is introduced including continuity and energy conservation functions. Finally, by using a 1D3V PIC-MCC code programmed by the authors, the ionization parameters are calculated under different microwave electric-field values, microwave frequencies, gas types and pressures for fluid modeling, including ionization frequency, breakdown delay time, average electron energy, electron energy distribution function (EEDF). The numerical results could be concluded as follows. Average electron energy is unrelated to EEDF type. At middle and low gas pressures, electron energy satisfies Maxwell distribution, and ionization parameters are unrelated to EEDF type. At middle and high gas pressures, ionization parameter is related to EEDF type, and the relevant coefficient X of EEDF tends to be of high older. Different gases have different EEDF types, and the relevant coefficient X of EEDF should be corrected by PIC simulation. The value of X is also related to microwave electric-field value and frequency, and its value increases with the increase of microwave electric-field value and the decrease of microwave frequency. In a fixed range (microwave electric-field value below 7 MV/m, and microwave frequency below 40 GHz), at middle and low gas pressures, the average electron energy increases with the increase of electric-field value and the decrease of microwave frequency rapidly, and the ionization frequency increases and then decreases with the increase of microwave electric-field value and frequency respectively; at high gas pressure, the average electron energy increases with the increase of electric-field value slowly, the ionization frequency increases with the increase of electric-field value, and the average electron energy and ionization frequency are unrelated to microwave frequency.
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Keywords:
- high power microwave flashover on dielectric surface /
- particle-in-cell simulation /
- fluid model /
- electron energy distribution
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[2] Neuber A A, Edmiston G F, Krile J T, Krompholz H, Dickens J C, Kristiansen M 2007 IEEE Trans. Magn. 43 496
[3] Ford P J, Beeson S R, Krompholz H G, Neuber A A 2012 Phys. Plasmas 19 073503
[4] Kim H C, Verboncoeur J P 2005 Phys. Plasmas 12 123504
[5] Kim H C, Verboncoeur J P 2007 IEEE Trans. Dielectr. Electr. Insul. 14 766
[6] Kim H C, Verboncoeur J P 2006 Phys. Plasmas 13 123506
[7] Nam S K, Verboncoeur J P 2008 Appl. Phys. Lett. 92 231502
[8] Nam S K, Verboncoeur J P 2008 Appl. Phys. Lett. 93 151504
[9] Nam S K, Lim C, Verboncoeur J P 2009 Phys. Plasmas 16 023501
[10] Chang C, Liu G, Tang C, Chen C, Fang J 2011 Phys. Plasmas 18 055702
[11] Cai L B, Wang J G 2009 Acta Phys. Sin. 58 3268 (in Chinese) [蔡利兵, 王建国 2009 物理学报 58 3268]
[12] Hao X W, Zhang G J, Qiu S, Huang W H, Liu G Z 2010 IEEE Trans. Plasma Sci. 38 1403
[13] Cheng G X, Liu L 2011 IEEE Trans. Plasma Sci. 39 1067
[14] Dong Y, Dong Z W, Zhou Q H, Yang W Y, Zhou H J 2013 High Power Laser and Particle Beams 25 2653 (in Chinese) [董烨, 董志伟, 周前红, 杨温渊, 周海京 2013 强激光与粒子束 25 2653]
[15] Dong Y, Dong Z W, Yang W Y, Zhou Q H, Zhou H J 2013 Acta Phys. Sin. 62 197901 (in Chinese) [董烨, 董志伟, 杨温渊, 周前红, 周海京 2013 物理学报 62 197901]
[16] Dong Y, Zhou Q H, Dong Z W, Yang W Y, Zhou H J, Sun H F 2013 High Power Laser and Particle Beams 25 950 (in Chinese) [董烨, 周前红, 董志伟, 杨温渊, 周海京, 孙会芳 2013 强激光与粒子束 25 950]
[17] Zhou Q H, Dong Z W 2011 Appl. Phys. Lett. 98 161504
[18] Vaughan J R M 1993 IEEE Trans. Electron. Dev. 40 830
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[1] Barker R J, Schamiloglu E 2001 High-Power Microwaves Sources and Technologies (New Jersey: IEEE Press) pp325–375
[2] Neuber A A, Edmiston G F, Krile J T, Krompholz H, Dickens J C, Kristiansen M 2007 IEEE Trans. Magn. 43 496
[3] Ford P J, Beeson S R, Krompholz H G, Neuber A A 2012 Phys. Plasmas 19 073503
[4] Kim H C, Verboncoeur J P 2005 Phys. Plasmas 12 123504
[5] Kim H C, Verboncoeur J P 2007 IEEE Trans. Dielectr. Electr. Insul. 14 766
[6] Kim H C, Verboncoeur J P 2006 Phys. Plasmas 13 123506
[7] Nam S K, Verboncoeur J P 2008 Appl. Phys. Lett. 92 231502
[8] Nam S K, Verboncoeur J P 2008 Appl. Phys. Lett. 93 151504
[9] Nam S K, Lim C, Verboncoeur J P 2009 Phys. Plasmas 16 023501
[10] Chang C, Liu G, Tang C, Chen C, Fang J 2011 Phys. Plasmas 18 055702
[11] Cai L B, Wang J G 2009 Acta Phys. Sin. 58 3268 (in Chinese) [蔡利兵, 王建国 2009 物理学报 58 3268]
[12] Hao X W, Zhang G J, Qiu S, Huang W H, Liu G Z 2010 IEEE Trans. Plasma Sci. 38 1403
[13] Cheng G X, Liu L 2011 IEEE Trans. Plasma Sci. 39 1067
[14] Dong Y, Dong Z W, Zhou Q H, Yang W Y, Zhou H J 2013 High Power Laser and Particle Beams 25 2653 (in Chinese) [董烨, 董志伟, 周前红, 杨温渊, 周海京 2013 强激光与粒子束 25 2653]
[15] Dong Y, Dong Z W, Yang W Y, Zhou Q H, Zhou H J 2013 Acta Phys. Sin. 62 197901 (in Chinese) [董烨, 董志伟, 杨温渊, 周前红, 周海京 2013 物理学报 62 197901]
[16] Dong Y, Zhou Q H, Dong Z W, Yang W Y, Zhou H J, Sun H F 2013 High Power Laser and Particle Beams 25 950 (in Chinese) [董烨, 周前红, 董志伟, 杨温渊, 周海京, 孙会芳 2013 强激光与粒子束 25 950]
[17] Zhou Q H, Dong Z W 2011 Appl. Phys. Lett. 98 161504
[18] Vaughan J R M 1993 IEEE Trans. Electron. Dev. 40 830
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