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中国物理学会期刊
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Li Wei-Qin, Huo Zhi-Sheng, Pu Hong-Bin. Transient characteristics of electron beam induced current in dielectric and semiconductor sampleJ. Acta Physica Sinica, 2020, 69(6): 060201. DOI: 10.7498/aps.69.20191543
Citation: Li Wei-Qin, Huo Zhi-Sheng, Pu Hong-Bin. Transient characteristics of electron beam induced current in dielectric and semiconductor sampleJ. Acta Physica Sinica, 2020, 69(6): 060201. DOI: 10.7498/aps.69.20191543
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Transient characteristics of electron beam induced current in dielectric and semiconductor sample

Acta Phys. Sin., 2020, 69(6): 060201.
DOI: 10.7498/aps.69.20191543
CSTR: 32037.14.aps.69.20191543
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