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Plasma technology plays an important role in preparing and processing materials nowadays. This review focuses on the applications of non-thermal plasma (NTP) in the surface treatment and functionalization of materials, including the plasma sources for generating plasmas, NTP techniques and specific application fields. The plasma sources include inductively coupled plasma, capacitively coupled plasma, electron cyclotron resonance plasma, surface wave plasma, helicon wave plasma, atmospheric pressure plasma jet, and dielectric barrier discharge plasma. The NTP techniques for material surface treatment and functionalization include plasma surface grafting and polymerization, plasma enhanced chemical vapor deposition, plasma assisted atomic layer deposition, plasma enhanced reactive ion etching, and plasma assisted atomic layer etching. Specific applications of plasma surface treatment and functionalization cover hydrophilic/hydrophobic surface modification, surface micro-nano processing, biological tissue surface treatment, and catalyst surfaces treatment. Finally, the application prospects and development trends of NTP technology for material surface treatment and functionalization are proposed.
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Keywords:
- plasma /
- surface treatment /
- grafting /
- polymerization /
- deposition /
- etching
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图 4 ALE过程示意图 (a) ALE工艺; (b) Si ALE工艺; (c) SiO2 ALD工艺. ALE工艺与ALD工艺类似, 区别在于反应B中发生钝化层的移除而不是吸附[103]
Figure 4. Schematic of ALE (a) generic concept, (b) for the Si case study, and (c) in comparison to SiO2 ALD. ALE is similar to ALD except that removal takes place instead of adsorption in reaction B[103].
图 5 H2等离子体表面处理石墨烯 (a)处理700 s时石墨烯的水接触角从原始样品的93°下降至16°; (b)改性石墨烯表面亲水性区域对癌细胞的吸附定位[114]
Figure 5. Modification of graphene by H2 plasma: (a) Control of the graphene wettability via hydrogenation. The as-grown graphene is hydrophobic, with a large wetting angle of 93°. As hydrogenation proceeds, leading to a very small wetting angle of 16° at 700 s. (b) Optical microscopic image of cancer cells positioned on the hydrophilic surface of patterned graphene[114].
表 1 几种非热等离子体源放电参数
Table 1. Discharge parameters of several NTP sources.
NTP源 频率/MHz 气压/Pa 电子温度/eV 电子密度/cm–3 磁场强度/G 参考文献 CCP 0.05—13.56 1—102 1—5 109—1011 0 蒲以康等[45] ICP 1—100 (常用13.56) 10–1—1 1—10 1011—1012 0 戴忠玲等[46] ECR 300—2450 (常用2450, 915) 10–2—10–1 2—20 1011—1013 0—1000 (与频率有关) Weng等[47] SWP 1—10000 (常用2450) 10–1—102 1—10 1011—1012 0 Moisan等[48] HWP 1—50 (常用13.56) 10–2—10 2—20 1011—1014 100—2000 Boivin等[49] APPJ 0—10000 105 1—5 1011—1014 0 吴淑群等[36] DBD 0.05—10 105 1—10 1014—1015 0 Wang等[39] 表 2 非热等离子体聚合物基材表面接枝和聚合
Table 2. Polymer substrate surface grafting and polymerization by NTP.
NTP源 改性气氛 改性基材 主要结论 参考文献 RF-CCP (13.56 MHz) Ar 棉、麻织物 超疏水性(↑)、穿着舒适度(↑) Xu等[74] RF-CCP (13.56 MHz, 20 W) C2H2 聚乳酸、聚已酸内酯 涂层附着性(↑)、氧气阻隔性(↑) Bélard等[75] RF-ICP (27.12 MHz, 200 W) O2, CO2 PET 亲水性(↑)、含氧基团数量(↑) Tkavc等[76] RF-ICP (13.56 MHz, 400 W) O2 PET 表面粗糙度(↑)、水接触角(↓)、
含氧基团数量(↑)Han等[77] MW-ECR (2.45 GHz, 300 W) Ar, AAc PP 表面张力(↑)、Cu涂层附着性(↑) Dayss等[78] MW-SWP (2.45 GHz, 250 W) CO2 聚四氟乙烯(PTFE) 水接触角(↓)、含氧基团数量(↑) Vasilets等[60] MW-SWP (2.45 GHz, 1600 W) Ar 氟基三聚物(THV) 含氧基团数量(↑) Sasai等[21] APPJ (50 kHz, 0—20 kV) TEOS/O2/Ar 聚全氟乙丙烯(FEP) 含硅基团数量(↑)、沿面闪络电压(↑) 胡多等[38] DBD (1 kHz, 25 kV) 空气 PET 表面粗糙度(↑)、水接触角(↓)、
含氧基团数量(↑)Fang等[79] DBD (RTR, 40 kHz) AAc, C2H6O, C3H7N PE 水接触角(↓)、Al 涂层附着性(↑) Zhang等[44] 表 3 非热等离子体沉积无机功能涂层
Table 3. Inorganic functional coatings deposited by NTP.
无机薄膜 NTP源 工作气氛 衬底 主要结论 参考文献 SiOx PECVD (DBD, 200 kHz, 3 kV) TEOS/O2/N2 PEN 附着性能(↑)、阻隔性能(↑) Starostin等[83] SiOx PECVD (CPP, 40 kHz, 50 W) HMDSO/O2 PVC 抗迁移性能(↑) Fei等[86,87] AlOx PECVD (1 Hz, 30 W) TMA/O2 硅片 沉积速率(↑)、薄膜纯度(↑) Seman等[88] DLC PECVD (RF, 13.56 MHz, 250 W) CH4 PTFE 薄膜质量(↑)、阻隔性能(↑) Ozeki等[89] a-C:H PECVD (RF, 13.56 MHz) C2H2/Ar PC, PET 薄膜硬度(↓)、阻隔性能(↑) Abbas等[90] a-C:H PECVD (RF, 13.56 MHz, 0-90 W) n-C6H14/Ar PET, 硅片 致密性(↑)、阻隔性能(↑) Polonsky等[80] SiOxCyHz PECVD (APPJ, 20 kHz, 350 V) 空气/HMDSO PP 阻隔性能(↑) Scopece等[84] SiOxCyH PECVD (MW-APPJ, 2.45 GHz, 2000 W) Ar/HMDSO 玻璃 抗雾性能(↑) Durocher-Jean等[85] AlxOy PAALD (CCP, 60 Hz, 500 W) TMA/O2 PEN WVTR: 8.85 × 10–4 g·m–2·d–1 Lee等[94] Al2O3 PAALD (RF-ICP) TMA/O2 PEN WVTR: 5.0 × 10–3 g·m–2·d–1 Langereis等[95] Al2O3/TiO2 PAALD (APPJ, 20 kHz, 350 V) TMA/TDMAT OTFT 防腐性能(↑)、阻隔性能(↑) Kim等[96] 表 4 非热等离子体辅助材料表面刻蚀
Table 4. Material surface etching assisted by NTP.
衬底 NTP源 刻蚀气体 主要结果 参考文献 Si PERIE (RF-APPJ, 13.56 MHz) He/N2/CF4 刻蚀速率: 0.068 mm3·min–1; RRMS: 0.2—2.44 nm Paetzelt等[98] SiC PERIE (RF-ICP, 6.78 MHz, 1000 W) SF6/O2 刻蚀速率: 1.28 µm·min–1; RRMS: 0.7 nm Osipov等[99] SiO2 PERIE (RF-ICP, 13.56 MHz, 500 W) Cl2 刻蚀速率: 2.2 nm·min-1 Petit-Etienne等[100] GaN PERIE (MW-ECR, 2.45 GHz, 850 W) Cl2 刻蚀速率: 0.28 μm·min–1; 刻蚀选择性: 39∶1 Harrison等[101] HfO2 PERIE (MW-ECR, 2.45 GHz, 600 W) CF4/Ar/O2 刻蚀速率: 0.36 nm·min–1; RRMS: 0.17 nm 罗童等[102] SiO2 PAALE (RF-ICP, 13.56 MHz) Ar/C4F8 刻蚀速率: 0.2—0.3 Å·s–1 Metzler等[105] GaN PAALE (RF-ICP) Cl2/Ar EPC: 0.4 nm·cycle–1; RRMS: 0.6 nm Ohba等[107] GaN PAALE (RF-ICP, 50 W) Cl2/Ar 刻蚀速率: 2.87 Å·cycle–1 Kauppinen等[108] ZnO PAALE (RF-ICP, 13.56 MHz, 200 W) Hacac/O2 EPC: 0.5—1.3 Å·cycle–1; 刻蚀选择性: 80∶1 Mameli等[110] SiO2 PAALE (RF-ICP, 13.56 MHz) Ar/C4F8 EPC: 0.4 nm·cycle–1; RRMS: 1.2 nm Antoun等[111] -
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