Review of fiber Bragg grating interrogation techniques based on array waveguide gratings

Li Ke; Dong Ming-Li; Yuan Pei; Lu Li-Dan; Sun Guang-Kai; Zhu Lian-Qing

doi:10.7498/aps.71.20212063

Abstract

The photonic integrated interrogation technology based on array waveguide grating is a hot but difficult research area in the silicon optical field. Compared with traditional interrogation methods, the photonic integration interrogation technology based on an array waveguide grating has obvious advantages in high-speed and high-precision demodulation of fiber Bragg gratings due to its high demodulation accuracy, fast demodulation speed, and small package size. In recent years, with the development of photonic integration technology, various research institutions and relevant organizations have conducted extensive and in-depth research and optimization on the photonic integration interrogation method of array waveguide gratings. In this paper we introduce the working principle of array waveguide grating and the principle of fiber Bragg grating wavelength interrogation based on array waveguide grating, the important progress of fiber Bragg grating interrogator based on array waveguide grating in both material system and system performance, and summarize the typical applications in interrogator based on array waveguide grating. The future development of fiber Bragg grating demodulation system is proposed from three aspects: new materials, system integration, and scale-up, which provides a reference for the research and development of photonic integrated interrogation technology based on array waveguide grating.

Keywords:

Authors and contacts

1.
Key Laboratory of the Ministry of Education for Optoelectronic Measurement Technology and Instrument, Beijing Information Science & Technology University, Beijing 100192, China
2.
Beijing Laboratory of Optical Fiber Sensing and System, Beijing Information Science & Technology University, Beijing 100016, China
3.
Beijing Key Laboratory of Optoelectronic Measurement Technology, Beijing Information Science & Technology University, Beijing 100192, China

Corresponding author: Dong Ming-Li, dongml@bistu.edu.cn ; Zhu Lian-Qing, lqzhu_bistu@sina.com

Funds: Project supported by the 111 Project of China (Grant No. D17021), the National Natural Science Foundation of China (Grant No. 51705024), and the Key Project of Beijing Municipal Education Commission Science and Technology Program (Grant No. KZ201911232044).

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References

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Cited By

图 1 AWG结构示意图

Figure 1. Structural diagram of AWG.

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图 2 基于AWG的FBG波长解调系统

Figure 2. FBG wavelength interrogation system based on AWG.

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图 3 AWG边缘滤波法波长解调原理图

Figure 3. Wavelength interrogation principle of edge filtering method using AWG.

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图 4 AWG相对强度法波长解调原理图

Figure 4. Wavelength interrogation principle of relative light intensity method using AWG.

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图 5 解调函数与3 dB带宽的关系^[54]

Figure 5. Dependence of interrogation function on the 3 dB bandwidth of AWG (W_{3 dB}).^[54]

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图 6 游标效应及时分复用技术的实现架构^[58]

Figure 6. Implementation architecture of AWG-based FBGI based on vernier effect and time-division multiplexing technology^[58].

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图 7 基于游标效应及时分复用技术的高精度波长解调实现方法^[53]

Figure 7. Realization of high-precision wavelength interrogation based on vernier effect and time-division multiplexing technology^[53].

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图 8 修改输入波导后的FBG波长解调系统　(a)基于AWG的解调仪原理图; (b) AWG输入的设计^[31]

Figure 8. FBG wavelength interrogation system with modified input waveguide: (a) Schematic of the AWG-based interrogator; (b) design of AWG inputs^[31].

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图 9 AWG传输谱(仅显示4—8通道)　(a)模拟波长响应; (b)测量响应^[31]

Figure 9. Modified AWG passbands, where only channels 4–8 are shown: (a) Simulated wavelength response; (b) measured wavelength response^[31].

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图 10 用于FBG传感解调的AWG芯片^[67]

Figure 10. An illustration of the AWG chip used for FBG sensor interrogation^[67].

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图 11 (a)混合电压传感器; (b)采用电压传感器和电流互感器的电流传感器; (c)磁致伸缩电流传感器^[72]

Figure 11. (a) Hybrid voltage sensor; (b) current sensor employing a voltage sensor and a current transformer; (c) magnetostrictive current sensor^[72].

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图 12 MRI监测系统^[34]

Figure 12. MRI monitoring system^[34].

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图 13 实验装置示意图^[77]

Figure 13. A schematic diagram for experimental set-up^[77].

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图 14 用于评估FBG麦克风的实验装置^[78]

Figure 14. Experimental setup for evaluating the FBG microphone^[78].

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表 1 基于AWG的FBG波长解调系统研究进展

Table 1. Research progress of FBG wavelength interrogation system based on AWG.

研究进展	研究成果	特点
分立组装^[23−27]		系统尺寸仍然很大
InP单片集成^[28−33]		偏振相关性明显
SOI混合/单片集成^[34−40]		单偏振工作, 工艺容差很小
SiO₂混合集成^[41−46]		器件尺寸相对较大, 但其他方面优势明显
聚合物混合集成^[47−50]		特殊应用, 成本较低

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表 2 不同衬底材料体系各自的优缺点以及主要应用场景

Table 2. Advantages and disadvantages of different substrates and their main application scenarios.

材料体系	优点	缺点	主要应用场景
SiO₂	波导损耗低; 与光纤耦合损耗低; 偏振相关性低; 成本低; 制备工艺成熟稳定	弯曲半径大(一般大于1 mm); 器件尺寸较大(大于几个mm²); 不能用来制备有源器件	主要用来制备无源波导器件, 如耦合器、分路器、滤波器、光开关等, 也可以实现无源与有源器件的混合集成
Si/SOI	制备工艺与CMOS兼容; 弯曲半径小(可到5 μm); 器件尺寸小	单偏振工作; 与光纤耦合损耗大; 制备工艺仍处于发展阶段	可制作无源器件, 利用其扩展材料体系(Ⅲ/Ⅴ-Si、Ge-Si)可实现有源、无源器件单片集成, 但目前混合集成占主导地位
InP	直接带隙半导体材料	偏振相关性明显; 工艺难度大	是制备光源、探测器等有源器件的理想成材率; 可真正意义上实现各种有源与无源器件的单片集成
聚合物	制造简单; 后续处理工作量小; 单位成本低	采样率较低; 光谱展宽和光学损耗方面性能较差	可用于制作无源器件, 如AWG、耦合器、光纤光栅等; 便于实现全聚合物传感系统的搭建

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表 3 基于AWG光子集成技术的波长解调仪指标对比

Table 3. Performance comparisons of FBGIs based on AWG-PIC technology with different substrates.

技术方案	材料体系	动态范围	采样率	光源输出功率	波长分辨率	复用能力
色散滤波器或AWG的波分复用技术^[42,47]	SiO₂	≤10000 με (1 FBG); ≤2500 με (12 FBG)	2 kHz (1 FBG); 20 kHz (5 FBG)	<5 dBm	±5 pm@ 100 Hz	色散滤波器: <12 FBG; AWG: >12
单片集成AWG光谱分析技术^[30]	InP	4000 με/4.8 nm (8 FBG)	19.2 kHz	外部光源: 5 mW (FBG反射率>90%)	5 pm	单通道: 8 FBG
混合集成AWG光谱分析技术^[38]	SOI	5—80 ℃	2 kHz	0.8 mW (–1 dBm)	±10 pm	波分复用: 8通道AWG实现4 FBG解调
混合集成AWG光谱分析技术^[51]	聚合物	3.0—4.2 V	2 Hz	6 mW (FBG反射率为90%)	1 pm	3通道AWG实现 1 FBG解调

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[2]	Kersey A D, Davis M A, Patrick H J, LeBlanc M, Koo K P, Askins C G, Putnam M A, Friebele E J 1997 J. Light. Technol. 15 1442 Google Scholar
[3]	Wang T, Liu K, Jiang J F, Xue M, Chang P X, Liu T G 2017 Opt. Express 25 14900 Google Scholar
[4]	Kersey A D, Berkoff T A, Morey W W 1993 Opt. Lett. 18 1370 Google Scholar
[5]	Yuan L B 2004 Opt. Laser. Technol. 36 365 Google Scholar
[6]	Fukuma N, Nakamura K, Ueha S 2005 Proceedings of 17th International Conference on Optical Fibre Sensors Bruges, Belgium, May 23, 2005 p852
[7]	吴开拓, 张继华, 张万里 2018 科技资讯 16 106 Google Scholar Wu K T, Zhang J H, Zhang W L 2018 Sci. Technol. Inf. 16 106 Google Scholar
[8]	Marin Y E, Nannipieri T, Oton C J, Pasquale F D 2018 J. Light. Technol. 36 946 Google Scholar
[9]	Marin Y E, Nannipieri T, Oton C J, Pasquale F D 2017 Proceedings of the 25th International Conference on Optical Fiber Sensors Jeju, Korea, April 23, 2017 p10323
[10]	Wang L P, Ren C, Cao D Z, Lan R J, Kang F 2021 Chin. Phys. B 30 064209 Google Scholar
[11]	Zhang W F, Yao J P 2020 Nat. Commun. 11 406 Google Scholar
[12]	Theurer M, Moehrle M, Sigmund A, Velthaus K O, Oldenbeuving R M, Wevers L, Postma F M, Mateman R, Schreuder F, Geskus D, Worhoff K, Dekker R, Heideman R G, Schell M 2020 J. Light. Technol. 38 2630 Google Scholar
[13]	陆子晴, 韩勤, 叶焓, 王帅, 肖峰, 肖帆 2021 物理学报 70 208501 Google Scholar Lu Z Q, Han Q, Ye H, Wang S, Xiao F, Xiao F 2021 Acta Phys. Sin. 70 208501 Google Scholar
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[15]	Li H Q, An Z X, Zhang S, Zuo S S, Zhu W, Zhang S S, Huang B J, Cao L, Zhang C, Zhang Z Y, Song W C, Mao Q H, Mu Y X, Miao C Y, Li E B, Garcia J D P 2021 ACS Photonics. 8 3607 Google Scholar
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[17]	Norman D C C, Webb D J, Pechstedt R D 2005 Meas. Sci. Technol. 16 691 Google Scholar
[18]	Norman D C C, Webb D J, Pechstedt R D 2004 Proceedings of the Optical Sensing Strasbourg, France, September 1, 2004 p101
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[23]	Buck T C, Müller M S, Plattner M, Koch A W 2009 Proceedings of the Optical Measurement Systems for Industrial Inspection VI Munich, Germany, June 17, 2009 p738930
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