-
The perfect absorption is achieved by the structure of a continuous metal film with symmetrical grating structure on both sides. The maximum absorption coefficient can reach 99.47% for a optimal structural parameters with a silver film thickness of 20 nm, a lattice constant of 400 nm, and a medium refractive index of 1.46. The full width of half maximum of the absorption line is about 2.53 nm, and the quality factor Q is 296.06. When the absorption is perfect, the reflection and transmission of the incident light are effectively suppressed, and the phase gradient of the absorption coefficient reaches a maximum value. The perfect absorption is determined by the long-range surface plasma polariton (LRSPP) with a little transmission loss, long propagation distance and deep penetration depth. And the electric field is mainly distributed outside the silver film with a standing wave distribution. As the thickness of the silver film decreases, the line width of the absorption spectrum gradually decreases, while the Q value and electric field strength increase. When the thickness drops to about 12 nm, the minimum line width is 0.98 nm and the maximum Q value is 760.0. The sharp absorption curve and very high quality factor at the perfect absorption can be used in the design and application of the highly sensitive micro-nano sensor.
[1] Ritchie R H 1957 Phys. Rev. 106 874
Google Scholar
[2] Barnes W L, Dereux A, Ebbesen T W 2003 Nature 424 824
Google Scholar
[3] Wang Z L 2009 Prog. Phys. 29 287
[4] Sarid D 1981 Phys. Rev. Lett. 47 1927
Google Scholar
[5] Bozhevolnyi S I, Volkov V S, Devaux E, Laluet J Y, Ebbesen T W 2006 Nature 440 508
Google Scholar
[6] Berini P 2009 Adv. Opt. Photonics 1 484
Google Scholar
[7] Berini P 2000 Opt. Express 7 329
Google Scholar
[8] Wong W R, Berini P 2019 Opt. Express 27 25470
Google Scholar
[9] Fuentes-Fuentes M A, May-Arrioja D A, Guzman-Sepulveda J R, Arteaga-Sierra F, Torres-Cisneros M, Likamwa P L, Sánchez-Mondragón J J 2019 Opt. Express 27 8858
Google Scholar
[10] Xu Y, Wang F, Gao Y, Zhang D, Sun X, Berini P 2020 Sensors 20 2507
Google Scholar
[11] Chen X I, Wenyi B U, Wu Z, Zhang H, Pu J 2021 Opt. Express 29 16455
Google Scholar
[12] Zakaria R, Zainuddin N, Fahri M, Thirunavakkarasu P M, Harun S W 2021 Opt. Fiber Technol. 61 102449
Google Scholar
[13] Hooper I R, Sambles J R 2004 Phys. Rev. B 70 045421
Google Scholar
[14] Sukharev M, Sievert P R, Seideman T, Ketterson J B 2009 J. Chem. Phys. 131 034708
Google Scholar
[15] Mu W, Buchholz D B, Sukharev M, Jang J I, Chang R P H, Ketterson J B 2010 Opt. Lett. 35 550
Google Scholar
[16] Mu W, Ketterson J B 2011 Opt. Lett. 36 4713
Google Scholar
[17] Abutoama M, Abdulhalim I 2015 Opt. Express 23 28667
Google Scholar
[18] Abutoama M, Abdulhalim I 2016 IEEE J. Sel. Top. Quant. 23 72
[19] 张凯, 杜春光, 高健存 2017 物理学报 66 227302
Google Scholar
Zhang K, Du C G, Gao J C 2017 Acta Phys. Sin. 66 227302
Google Scholar
[20] Zeng L W, Chen M, Yan W, Li Z F, Yan F H 2020 Opt. Commun. 457 124641
Google Scholar
[21] Joseph S, Sarkar S, Joseph J 2020 ACS Appl. Mater. Interfaces 12 46519
Google Scholar
[22] Wang Z L, Li S Q, Chang R P H, Ketterson J B 2014 J. Appl. Phys. 116 033103
Google Scholar
[23] 薛润玉, 王正宇, 王正岭 2022 光学学报 42 228
Xue R Y, Wang Z Y, Wang Z L 2022 Acta Opt. Sin. 42 228
[24] Ebbesen T W, Lezec H J, Ghaemi H F, Thio T, Wolff P A 1998 Nature 391 667
Google Scholar
-
图 1 (a) 连续金属膜对称光栅结构示意图; (b) Comsol模拟的结构单元
Figure 1. (a) Schematic diagram of the symmetric grating structure on a continuous metal film; (b) structural units of the Comsol simulation.
图 2 当h = 172.4 nm, d = 364.1 nm时, T, R及T+R的谱线图
Figure 2. Evolution of T, R and T + R with wavelength as h = 172.4 nm and d = 364.1 nm.
图 3 当d = 364.1 nm, 不同h时的T+R随波长演化曲线
Figure 3. Evolution of T + R with wavelength for different h as d = 364.1 nm.
图 4 当d = 364.1 nm时, T + R 的极小值与对应波长随h的演化 (a) T + R 极小值随h的演化; (b) T + R 极小值对应波长随h的演化
Figure 4. Evolution of the minima of T + R and the corresponding wavelength with h as d = 364.1 nm: (a) Evolution of the minima with h; (b) evolution of the corresponding wavelength with h
图 5 当h = 172.4 nm时, 不同d时T+R随波长演化曲线
Figure 5. Evolution of T + R with wavelength for different d as h = 172.4 nm.
图 6 当h = 172.4 nm时, T + R 的极小值与对应波长随d的演化 (a) T + R 极小值随d的演化; (b) T + R 极小值对应波长随d的演化
Figure 6. Evolution of the minima of T + R and the corresponding wavelength with d as h = 172.4 nm: (a) Evolution of the minima with d; (b) evolution of the corresponding wavelength with d
图 7 当h = 172.4 nm, d = 350.0 nm,
$ {\lambda _0} $ = 550.0 nm时, LRSPP的电场Ey在x-y平面上分布 (a) Ey在x-y平面上的二维分布; (b) 在x = 100 nm处, Ey在y方向上的分布Figure 7. The distribution of Ey of LRSPP in the x-y plane as h = 172.4 nm, d = 350.0 nm,
$ {\lambda _0} $ = 550.0 nm: (a) 2D distribution of Ey in the x-y plane; (b) the distribution of Ey in the y direction as x = 100 nm.
图 8 当h = 172.4 nm, d = 350.0 nm,
$ {\lambda _0} $ = 725.0 nm时, SRSPP的电场Ey在x-y平面上分布 (a) Ey在x-y平面上的二维分布; (b) 在x = –110 nm处, Ey在y方向上的分布Figure 8. The distribution of Ey of SRSPP in the x-y plane as h = 172.4 nm, d = 350.0 nm,
$ {\lambda _0} $ = 725.0 nm: (a) 2D distribution of Ey in the x-y plane ; (b) the distribution of Ey in the y direction as x = –110 nm.
图 9 完美吸收状态时4种典型的Ey分布
Figure 9. Typical distribution of Ey at the perfect absorption.
图 10 吸收谱相位以及其相位梯度随波长演化
Figure 10. Evolution of the phase from absorption spectrum and its gradient with wavelength.
图 11 第一布里渊区内的色散曲线
Figure 11. Dispersion curves in the first Brillouin zone.
图 12 在完美吸收情况下品质因子和线宽随银膜厚度的变化关系
Figure 12. The relationship between quality factor and line width with silver film thickness under perfect absorption.
图 13 当d = 320 nm, h = 200 nm, t = 20 nm时气体折射率由1变化到1.005时, T+R谱变化情况
Figure 13. The absorption spectrum of the gas refractive index changes from 1 to 1.005 as d = 320 nm, h = 200 nm, t = 20 nm.
图 14 折射率在1.000—1.005范围内时, 灵敏度随介质宽度d变化的示意图
Figure 14. Schematic representation of the sensitivity varying with d in the refractive index range from 1.000 to 1.005.
图 15 折射率在1.000—1.005范围内时, 灵敏度随介质高度h变化的示意图
Figure 15. Schematic representation of the sensitivity varying with h in the refractive index range from 1.000 to 1.005.
-
[1] Ritchie R H 1957 Phys. Rev. 106 874
Google Scholar
[2] Barnes W L, Dereux A, Ebbesen T W 2003 Nature 424 824
Google Scholar
[3] Wang Z L 2009 Prog. Phys. 29 287
[4] Sarid D 1981 Phys. Rev. Lett. 47 1927
Google Scholar
[5] Bozhevolnyi S I, Volkov V S, Devaux E, Laluet J Y, Ebbesen T W 2006 Nature 440 508
Google Scholar
[6] Berini P 2009 Adv. Opt. Photonics 1 484
Google Scholar
[7] Berini P 2000 Opt. Express 7 329
Google Scholar
[8] Wong W R, Berini P 2019 Opt. Express 27 25470
Google Scholar
[9] Fuentes-Fuentes M A, May-Arrioja D A, Guzman-Sepulveda J R, Arteaga-Sierra F, Torres-Cisneros M, Likamwa P L, Sánchez-Mondragón J J 2019 Opt. Express 27 8858
Google Scholar
[10] Xu Y, Wang F, Gao Y, Zhang D, Sun X, Berini P 2020 Sensors 20 2507
Google Scholar
[11] Chen X I, Wenyi B U, Wu Z, Zhang H, Pu J 2021 Opt. Express 29 16455
Google Scholar
[12] Zakaria R, Zainuddin N, Fahri M, Thirunavakkarasu P M, Harun S W 2021 Opt. Fiber Technol. 61 102449
Google Scholar
[13] Hooper I R, Sambles J R 2004 Phys. Rev. B 70 045421
Google Scholar
[14] Sukharev M, Sievert P R, Seideman T, Ketterson J B 2009 J. Chem. Phys. 131 034708
Google Scholar
[15] Mu W, Buchholz D B, Sukharev M, Jang J I, Chang R P H, Ketterson J B 2010 Opt. Lett. 35 550
Google Scholar
[16] Mu W, Ketterson J B 2011 Opt. Lett. 36 4713
Google Scholar
[17] Abutoama M, Abdulhalim I 2015 Opt. Express 23 28667
Google Scholar
[18] Abutoama M, Abdulhalim I 2016 IEEE J. Sel. Top. Quant. 23 72
[19] 张凯, 杜春光, 高健存 2017 物理学报 66 227302
Google Scholar
Zhang K, Du C G, Gao J C 2017 Acta Phys. Sin. 66 227302
Google Scholar
[20] Zeng L W, Chen M, Yan W, Li Z F, Yan F H 2020 Opt. Commun. 457 124641
Google Scholar
[21] Joseph S, Sarkar S, Joseph J 2020 ACS Appl. Mater. Interfaces 12 46519
Google Scholar
[22] Wang Z L, Li S Q, Chang R P H, Ketterson J B 2014 J. Appl. Phys. 116 033103
Google Scholar
[23] 薛润玉, 王正宇, 王正岭 2022 光学学报 42 228
Xue R Y, Wang Z Y, Wang Z L 2022 Acta Opt. Sin. 42 228
[24] Ebbesen T W, Lezec H J, Ghaemi H F, Thio T, Wolff P A 1998 Nature 391 667
Google Scholar
DownLoad:
Catalog
Metrics
- Abstract views: 3189
- PDF Downloads: 70
- Cited By: 0
