Stress-thermal aging properties of silicone rubber used for cable accessories and electric-thermal-stress multiple fields coupling simulation

Li Guo-Chang; Guo Kong-Ying; Zhang Jia-Hao; Sun Wei-Xin; Zhu Yuan-Wei; Li Sheng-Tao; Wei Yan-Hui

doi:10.7498/aps.73.20231869

Abstract

During the long-term operation of a cable, the electrical field, high temperature, and interface stress may age or deteriorate the silicon rubber (SIR) insulation of the cable accessories, affecting the combined electrical-thermal-force performance of the accessories, and easily causing discharge faults. In this work, the electrical-thermal-force properties of silicone rubber for cable accessories under thermal aging and combined force-thermal aging are studied experimentally and numerically. The changes and mechanisms of physical and chemical properties, electrical properties, thermal properties and mechanical properties of silicone rubber are tested and compared before and after aging. The changes of electric, thermal and force field of cable accessories, caused by the change of SIR material parameters under different aging time and aging form, are further simulated. The experimental results show that the crosslinking degree and molecular motion system of SIR will change with the deepening of the aging degree, which will change the electrical-thermal-force properties of the material to different degree. After aging, large agglomeration protrudes and small cavities appear in SIR section, and the damage is more serious under force-thermal aging. The relative dielectric constant first decreases and then increases with the aging time increasing. The volume resistivity, breakdown strength and flashover voltage all first increase and then decrease. The thermal conductivity first increases and then decreases with aging time increasing. In addition, with the increase of aging time, the tensile strength and elongation at break decrease gradually. Considering the change of properties after aging, the destruction of SIR material by force-thermal aging is more serious. The simulation results show that under the two aging modes, the maximum electric field strength at the stress cone root of the cable accessories first increases and then decreases with the increase of time. The electric field strength at the stress cone root of the cable accessories, caused by the force-thermal aging, changes little, maintaining about 2.2 kV/mm. The difference in temperature between the inside and the outside of the insulation layer is obvious under different aging degree, and the temperature difference shows a first decreasing and then increasing trend under both aging modes, and the maximum temperature gradient is 9.15 ℃. The interface stress at the stress cone root decreases from 0.263 to 0.230 MPa, which is about 12.5% lower. This work has guiding significance in evaluating the insulation performance and analyzing the fault of distribution cable accessories.

Keywords:

cable accessories /
silicone rubber /
stress-thermal aging /
electric-thermal-stress coupling simulation

Authors and contacts

1.
Shandong Engineering Research Center of High Voltage Insulation System and Advanced Electrical Materials, Institute of Advanced Electrical Materials, Qingdao University of Science and Technology, Qingdao 266042, China
2.
State Key Laboratory of Electrical Insulation and Power Equipment, Xi’an Jiaotong University, Xi’an 710049, China

Corresponding author: Wei Yan-Hui, Weiyhui@126.com

Funds: Project supported by the National Natural Science Foundation of China (Grant No. 52107154).

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References

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Cited By

图 1 试样制备与老化试验流程图

Figure 1. Flow chart of specimen preparation and aging test.

DownLoad: Full-Size Img PowerPoint

图 2 老化后SIR试样断面微观形貌图　(a) 0 h空白对照组; (b) 热老化720 h; (c) 热老化2160 h; (d) 力-热老化720 h; (e) 力-热老化2160 h

Figure 2. Microscopic morphology of the section of the aged SIR specimens: (a) Unaged 0 h; (b) thermal aging 720 h; (c) thermal aging 2160 h; (d) force-thermal aging 720 h; (e) force-thermal aging 2160 h.

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图 3 老化后SIR试样FTIR图谱　(a) 热老化SIR试样FTIR图谱变化规律; (b) 力-热老化SIR试样FTIR图谱变化规律

Figure 3. FTIR spectra of the aged SIR specimens: (a) Changes of FTIR spectra of heat-aged SIR samples; (b) changes of FTIR spectra of force-thermal aging SIR samples.

DownLoad: Full-Size Img PowerPoint

图 4 老化后SIR试样相对介电常数　(a) 热老化SIR试样介电常数变化; (b)力-热老化SIR试样介电常数变化

Figure 4. Relative permittivity of the aged SIR specimens: (a) Changes in dielectric constant of SIR samples after thermal aging; (b) changes in the dielectric constant of SIR samples during strength-thermal aging.

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图 5 老化后SIR试样体积电阻率变化

Figure 5. Volume resistivity variations of the aged SIR specimens.

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图 6 老化后SIR试样击穿场强变化　(a) 热老化SIR试样击穿场强变化; (b) 力-热老化SIR试样击穿场强变化

Figure 6. Breakdown strength variations of the aged SIR samples: (a) Change of breakdown field strength of thermally-aged SIR samples; (b) changes in breakdown field strength of force-thermal aging SIR samples.

DownLoad: Full-Size Img PowerPoint

图 7 老化后SIR试样导热系数　(a) 热老化SIR试样导热系数变化; (b) 力-热老化SIR试样导热系数变化

Figure 7. Thermal conductivity of the aged SIR specimens: (a) Changes of thermal conductivity of SIR samples during thermal aging; (b) changes in thermal conductivity of SIR samples during force-thermal aging.

DownLoad: Full-Size Img PowerPoint

图 8 老化后SIR试样拉伸强度变化

Figure 8. Tensile strength variations of the aged SIR specimens.

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图 9 老化后SIR试样断裂伸长率变化

Figure 9. Elongation at break variations of the aged SIRspecimens.

DownLoad: Full-Size Img PowerPoint

图 10 橡胶材料拉伸应力-应变曲线及 Yeoh 拟合曲线

Figure 10. Tensile stress-strain curve and Yeoh fitting curve of rubber materials.

DownLoad: Full-Size Img PowerPoint

图 11 电缆附件最大畸变电场随时间的变化

Figure 11. Variation of the maximum electric field of the cable accessory with time.

DownLoad: Full-Size Img PowerPoint

图 12 最大电场强度随老化时间变化

Figure 12. Variation of the maximum electric field with aging time.

DownLoad: Full-Size Img PowerPoint

图 13 电缆附件温度场分布

Figure 13. Temperature field distribution of the cable accessories.

DownLoad: Full-Size Img PowerPoint

图 14 应力锥根部温度与内外侧温差随老化时间变化

Figure 14. Variation of the stress cone root temperature and temperature difference with aging time.

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图 15 电缆附件界面压力分布

Figure 15. Interface stress distribution of the cable accessory.

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图 16 电缆附件界面压力随过盈量变化

Figure 16. Interface stress variation with the interference.

DownLoad: Full-Size Img PowerPoint

图 17 应力锥根部界面压力随老化时间变化

Figure 17. Stress cone root interface stress variation with the aging time.

DownLoad: Full-Size Img PowerPoint

表 1 老化后SIR试样击穿场强的α和β

Table 1. Breakdown strength α and β of SIR specimens after aging.

老化时间/h	热老化		力-热老化
老化时间/h	α/(kV·mm^–1)	β	α/(kV·mm^–1)	β
0	25.49	26.20	25.49	26.20
168	25.83	48.98	26.39	17.50
720	26.48	41.33	26.48	37.82
1440	26.95	23.27	27.51	20.89
2160	25.83	23.30	25.45	34.53

DownLoad: CSV

表 2 老化后SIR试样闪络电压变化

Table 2. Flashover voltage variations of aged SIR specimens.

老化时间/h	老化类型
老化时间/h	热老化/kV	力-热老化/kV
0	6.25	6.25
168	6.39	6.52
720	7.36	6.84
1440	5.76	5.55
2160	5.55	5.31

DownLoad: CSV

表 3 Yeoh 模型拟合参数

Table 3. Fitting parameters of Yeoh model.

材料类型	Yeoh模型拟合参数/MPa
材料类型	C₁₀	C₂₀	C₃₀
空白对照	0.21	2.21×10^–4	–4.11×10^–7

DownLoad: CSV

表 4 老化后SIR试样Yeoh模型参数

Table 4. Yeoh model parameters of the aged SIR specimens.

老化类型	C₁₀	C₂₀/10^–4	C₃₀/10^–6
空白对照	0.21	2.12	–0.411
热老化 168 h	0.23	2.24	–0.913
热老化 720 h	0.25	0.356	–1.81
热老化 1440 h	0.32	8.26	–5.30
热老化 2160 h	0.25	1.45	–0.224
力-热老化 168 h	0.22	1.63	–0.644
力-热老化 720 h	0.26	4.59	–2.48
力-热老化 1440 h	0.31	7.03	–4.82
力-热老化 2160 h	0.24	1.75	–1.53

DownLoad: CSV

[1]	Zhang Z P, Zhao J K, Zhao W, Zhong L S, Hu L X, Rao W B, Zheng M, Meng S X 2022 High Voltage 5 69 Google Scholar
[2]	Li Z R, Zhou K, Meng P F, Yuan H, Wang Z K, Chen Y D, Li Y, Zhu G Y 2021 High Voltage 7 802 Google Scholar
[3]	Wang X, Wang C, Wu K, Tu D M, Liu S, Peng J K 2014 IEEE Trans. Dielectr. Electr. Insul. 21 5 Google Scholar
[4]	Liu Y, Wang X 2019 IEEE Trans. Dielectr. Electr. Insul. 26 2027 Google Scholar
[5]	Du B X, Han T, Su J G 2014 IEEE Trans. Dielectr. Electr. Insul. 21 503 Google Scholar
[6]	Wei Y H, Zhang J H, Li G C, Hu K, Nie Y J, Li S T, Hao C C, Lei Q Q 2023 IEEE Trans. Dielectr. Electr. Insul. 30 359 Google Scholar
[7]	周远翔, 张征辉, 张云霄, 朱小倩, 黄猛 2022 电工技术学报 37 4474 Google Scholar Zhou Y X, Zhang Z H, Zhang Y X, Zhu X Q, Huang M 2022 Trans. Chin. Electrotech. Soc. 37 4474 Google Scholar
[8]	程子霞, 刘杰, 张云宵, 周远翔, 张灵, 沙彦超 2019 高电压技术 45 470 Google Scholar Cheng Z X, Liu C, Zhang Y X, Zhou Y X, Zhang L, Sha Y C 2019 High Voltage Eng. 45 470 Google Scholar
[9]	王若丞, 贺云逸, 康洪玮, 王昭, 金海云 2021 高电压技术 47 3181 Google Scholar Wang R C, He Y Y, Kang H W, Wang Z, Jin H Y 2021 High Voltage Eng. 47 3181 Google Scholar
[10]	Zhang Y Y, Deng Y K, Wei W C, Xu W C, Zha J W 2023 Cellulose 30 5321 Google Scholar
[11]	王佩龙 2011 电线电缆 10 1 Google Scholar Wang P L 2011 Electric Wire Cable 10 1 Google Scholar
[12]	李国倡, 李雪静, 刘明月, 魏艳慧, 雷清泉, 周自强, 胡列翔, 王少华 2022 高压电器 58 31 Google Scholar Li G C, Li X J, Liu M Y, Wei Y H, Lei Q Q, Zhou Z Q, Hu L X, Wang S H 2022 High Voltage Appar. 58 31 Google Scholar
[13]	Du B X, Zhang M M, Han T, Zhu L W 2016 IEEE Trans. Dielectr. Electr. Insul. 23 104 Google Scholar
[14]	Zuidema C, Kegerise W, Fleming R, Welker M, Boggs S 2011 IEEE Electr. Insul. Mag. 4 45 Google Scholar
[15]	方春华, 刘浩春, 任志刚, 郭卫, 李景, 张帅, 周雨秋 2019 高压电器 55 65 Google Scholar Fang C H, Liu H C, Ren Z G, Guo W, Li J, Zhang S, Zhou Y Q 2019 High Voltage Appar. 55 65 Google Scholar
[16]	Barber K, Alexander G 2013 IEEE Electr. Insul. Mag. 29 27 Google Scholar
[17]	周远翔, 张云霄, 张旭, 刘睿, 王明渊, 高胜友 2014 高电压技术 40 979 Google Scholar Zhou Y X, Zhang Y X, Zhang X, Liu R, Wang M Y, Gao S Y 2014 High Voltage Eng. 40 979 Google Scholar
[18]	Kashi S, Varley R, De Souza M, Al-Assafi S, Di Pietro A, De Lavigne C, Fox B 2018 Polym. Plast. Technol. Eng. 57 1687 Google Scholar
[19]	Ito S, Hirai N, Ohki Y 2020 IEEE Trans. Dielectr. Electr. Insul. 27 722 Google Scholar
[20]	杜伯学, 苏金刚, 徐航, 韩涛 2016 中国电机工程学报 36 6627 Google Scholar Du B X, Su J G, Xu H, Han T 2016 Proc. CSEE 36 6627 Google Scholar
[21]	刘昌, 惠宝军, 傅明利, 刘通, 侯帅, 王晓游 2018 高电压技术 44 518 Google Scholar Liu C, Hui B J, Fu M L, Liu T, Hou S, Wang X Y 2018 High Voltage Eng. 44 518 Google Scholar
[22]	王成江, 郭鸣锐, 张扬, 曾洪平, 张婧, 祝梦雅 2022 绝缘材料 55 94 Google Scholar Wang C J, Guo M R, Zhang Y, Zeng H P, Zhang J, Zhu M Y 2022 Insul. Mater. 55 94 Google Scholar
[23]	祝贺, 何峻旭, 郑亚松, 曹煜锋, 郭维 2023 电工技术学报 139 65 Google Scholar Zhu H, He J X, Zheng Y S, Cao Y F, Guo W 2023 Trans. Chin. Electrotech. Soc. 139 65 Google Scholar
[24]	Wei W C, Chen H Q, Zha J W, Zhang Y Y 2023 Front. Chem. Sci Eng. 17 991 Google Scholar

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