A review of first-principles calculation methods for defects in semiconductors

Li Chen-Hui; Zhang Chen; Cai Xue-Fen; Zhang Cai-Xin; Yuan Jia-Yi; Deng Hui-Xiong

doi:10.7498/aps.73.20231960

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Li Chen-Hui, Zhang Chen, Cai Xue-Fen, Zhang Cai-Xin, Yuan Jia-Yi, Deng Hui-Xiong. A review of first-principles calculation methods for defects in semiconductorsJ. Acta Physica Sinica, 2024, 73(6): 066105. DOI: 10.7498/aps.73.20231960

Citation:

Li Chen-Hui, Zhang Chen, Cai Xue-Fen, Zhang Cai-Xin, Yuan Jia-Yi, Deng Hui-Xiong. A review of first-principles calculation methods for defects in semiconductorsJ. Acta Physica Sinica, 2024, 73(6): 066105. DOI: 10.7498/aps.73.20231960

Citation:

Li Chen-Hui, Zhang Chen, Cai Xue-Fen, Zhang Cai-Xin, Yuan Jia-Yi, Deng Hui-Xiong. A review of first-principles calculation methods for defects in semiconductorsJ. Acta Physica Sinica, 2024, 73(6): 066105. DOI: 10.7498/aps.73.20231960