Electron microscopy study of interface structure in infinite-layer nickelate-based superconducting thin films

LI Boyu; HU Kejun; LIN Renju; HAN Kun; HUANG Zhen; GE Binghui; SONG Dongsheng

doi:10.7498/aps.74.20250171

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LI Boyu, HU Kejun, LIN Renju, HAN Kun, HUANG Zhen, GE Binghui, SONG Dongsheng. Electron microscopy study of interface structure in infinite-layer nickelate-based superconducting thin filmsJ. Acta Physica Sinica, 2025, 74(12): 128701. DOI: 10.7498/aps.74.20250171

Citation:

LI Boyu, HU Kejun, LIN Renju, HAN Kun, HUANG Zhen, GE Binghui, SONG Dongsheng. Electron microscopy study of interface structure in infinite-layer nickelate-based superconducting thin filmsJ. Acta Physica Sinica, 2025, 74(12): 128701. DOI: 10.7498/aps.74.20250171

Citation:

LI Boyu, HU Kejun, LIN Renju, HAN Kun, HUANG Zhen, GE Binghui, SONG Dongsheng. Electron microscopy study of interface structure in infinite-layer nickelate-based superconducting thin filmsJ. Acta Physica Sinica, 2025, 74(12): 128701. DOI: 10.7498/aps.74.20250171