PIC/MCC simulation of the ionization process of SWP influenced by gas pressure and SPP
Acta Physica Sinica
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Acta Phys. Sin  2013, Vol. 62 Issue (19): 195204     doi:10.7498/aps.62.195204
PHYSICS OF GASES, PLASMAS, AND ELECTRIC DISCHARGES Current Issue| Archive| Adv Search  |   
PIC/MCC simulation of the ionization process of SWP influenced by gas pressure and SPP
Chen Zhao-Quan1, Xia Guang-Qing2, Liu Ming-Hai3, Zheng Xiao-Liang1, Hu Ye-Lin1, Li Ping1, Xu Gong-Lin1, Hong Ling-Li1, Shen Hao-Yu1, Hu Xi-Wei3
1. College of Electrical & Information Engineering, Anhui University of Science and Technology, Huainan 232001, China;
2. State Key Laboratory of Structural Analysis for Industrial Equipment, Dalian University of Technology, Dalian 116024, China;
3. State Key Laboratory of Advanced Electromagnetic Engineering and Technology, Huazhong University of Science and Technology, Wuhan 430074, China
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