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SrTiO3 (STO) films were deposited onto the ptype Si substrates by metalorganic decomposition (MOD) technique. The dielectric and interface characteristics of STO with a metalinsulatorsemiconductor(MIS) structure were investigated. The results showed that the dielectric constant was about 105 and the dissipation factor was lower than 001 for our STO films at a frequency of 10kHz. The excellent dielectric properties were attributed to the polycrystalline structure with good crystallinity. The fixed charge density Nf and the interfacetrap density Dit were calculated to be about 15×1012cm-2 and (14—35)×1012cm-2eV-1, respectively. Both Nf and Dit were mainly connected with an interface layer with low dielectric constant formed at the interface of Si/STO.
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Keywords:
- SrTiO3 films /
- MIS structure /
- dielectric characteristics /
- Si/STO interface
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