Measurements of line strengths for some lines of ammonia in 6611-6618 cm-1

Nie Wei; Kan Rui-Feng; Xu Zhen-Yu; Yang Chen-Guang; Chen Bing; Xia Hui-Hui; Wei Min; Chen Xiang; Yao Lu; Li Hang; Fan Xue-Li; Hu Jia-Yi

doi:10.7498/aps.66.054207

Abstract

The target gas molecular absorption spectrum parameters especially line strengths are very important for measuring temperature and concentration with tunable diode laser absorption spectroscopy (TDLAS) technique. Usually, researchers use line strengths which come from spectrum database, like HITRAN and GEISA and HITEMP spectra database, but those database include values from the theoretical computation, as is well known, there is a big error between the theoretical value and the actual value. In order to modify the line strengths of the database, 20 ammonia spectrum absorption lines in a wavenumber range between 6611 and 6618 cm-1 are measured at different pressures by using direct tunable diode laser absorption spectroscopy (dTDLAS) technique. The measurement procedure is repeated at least 10 times at each pressure, and then average value is calculated. Voigt fitting is used to obtain all line integral area, and then the line integral area is obtained by linear fitting. The slope of the fitting straight line equals line strength. Uncertainty analysis is given for the measurements. The measured linestrength is a function of integrated area, temperature, pressure, species mole fraction and effective path length. So, the calculated linestrength uncertainties based on those parameters uncertainties, and the uncertainties of pressure, species mole fraction and effective path length are similar for all transitions with P =0.25%, =0.2%, and L =0.4%. The uncertainties of the integrated area and temperature are related to different lines, and their values come from the actual measurement. In the end, uncertainty propagation formula is used to calculate linestrength uncetainty. Uncertainties of our measured line strengths are in a 0.81%-3.33% range. Our measured line strength values are different from line strengths in the HITRAN 2012 database, and the deviations are in 0.51%-17.28% range.

Keywords:

ammonia /
tunable diode laser absorption spectroscopy /
line strengths /
uncertainties

Authors and contacts

1.
Key Laboratory of Environmental Optics and Technology, Anhui Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Hefei 230031, China;
2.
University of Science and Technology of China, Hefei 230026, China

Corresponding author: Kan Rui-Feng, kanruifeng@aiofm.ac.cn

Funds: Project supported by the National Key Scientific Instrument and Equipment Development Project of China (Grant No. 2014YQ060537).

References

[1]	Wang F, Huang Q X, Li N, Yan J H, Chi Y, Cen K F 2007Acta Phys.Sin. 56 3867(in Chinese)[王飞, 黄群星, 李宁, 严建华, 池涌, 岑可法2007物理学报56 3867]
[2]	Yury A B, Anatoliy A K, Gerard W, Frank K T, Terence H R, John D B 2008LACSEA LMB4
[3]	Rafal L, Anatoliy A K, David M T, Terence H R, Steven S, Timothy B S, Frank K T 2011SPIE 7945K1
[4]	Rothman L S, Gordon I E, Babikov Y, et al. 2013J.Quant.Spectrosc.Radiat.Transfer 130 4
[5]	Jacquinet-Husso N, Scott N A, Chdin A, et al. 2008J.Quant.Spectrosc.Radiat.Transfer 109 1043
[6]	Rothman L S, Gordon I E, Barber R J, Dothe H, Gamache R R, Goldman A, Perevalov V I, Tashkun S A, Tennyson J 2010J.Quant.Spectrosc.Radiat.Transfer 111 2139
[7]	Paldus B A, Harb C C, Spence T G, Zare R N, Gmachl C, Capasso F, Sivco D L, Baillargeon J N, Hutchinson A L, Cho A Y 2000Opt.Lett. 25 666
[8]	Manne J, Sukhorukov O, Jger W, Tulip J 2006Appl.Opt. 45 9230
[9]	O'Leary D M, Orphal J, Ruth A A, Heitmann U, Chelin P, Fellows C E 2008J.Quant.Spectrosc.Radiat.Transfer 109 1004
[10]	Barton E J, Yurchenko S N, Tennyson J, Clausen S, Fateev A 2015J.Quant.Spectrosc.Radiat.Transfer 167 126
[11]	Guinet M, Jeseck P, Mondelain D, Pepin I, Janssen C, Camy-Peyret C, Mandin J Y 2011J.Quant.Spectrosc.Radiat.Transfer 112 1950
[12]	Naumenko O V, Bguier S, Leshchishina O M, Campargue A 2010J.Quant.Spectrosc.Radiat.Transfer 111 36
[13]	Webber M E, MacDonald T, Pushkarsky M B, Patel C K N, Zhao Y, Marcillac N, Mitloehner F M 2005Meas.Sci.Technol. 16 1547
[14]	Milton B, da Marcelo G S, Marcelo S S, Delson U S, Helion V, Andras M, Peter H 2006Appl.Opt. 45 4966
[15]	Maddaloni P, Gagliardi G, Malara P, de Natale P 2005Appl.Phys.B 80 141
[16]	Tiwari V B, Singh S, Mishra S R, Rawat H S, Mehendale S C 2006Appl.Phys.B 83 93
[17]	Michael E W, Douglas S B, Ronald K H 2001Appl.Opt. 40 2031
[18]	Xu L H, Liu Z, Yakovlev I, Tretyakov M Y, Lees R M 2004Infrared Phys.Technol. 45 31
[19]	Jia H, Zhao W, Cai T, Chen W, Zhang W, Gao X 2009J.Quant.Spectrosc.Radiat.Transfer 110 347
[20]	Gibb J S, Hancock G, Peverall R, Ritchie G A D, Russell L J 2004Eur.Phys.J.D 28 59
[21]	Sur R, Spearrin R M, Peng W Y, Strand C L, Jeffries J B, Enns G M, Hanson R K 2016J.Quant.Spectrosc.Radiat.Transfer 175 90
[22]	Romh J E, Cacciani P, Taher F, Čermk P, Coslou J, Khelkhal M A 2016J.Mol.Spectrosc. 4 1
[23]	He Y, Zhang Y J, Wang L M, You K 2012Opt.Technol. 38 421(in Chinese)[何莹, 张玉钧, 王立明, 尤坤2012光学技术38 421]
[24]	Schilt S 2010Appl.Phys.B 100 1
[25]	Zhou X 2005Ph.D.Dissertation(California:Stanford University)
[26]	Chen J Y, Liu J G, He Y B, Wang L, Jiang Q, Xu Z Y, Yao L, Yuan S, Ruan J, He J F, Dai Y H, Kan R F 2013Acta Phys.Sin. 62 224206(in Chinese)[陈玖英, 刘建国, 何亚柏, 王辽, 冮强, 许振宇, 姚路, 袁松, 阮俊, 何俊峰, 戴云海, 阚瑞峰2013物理学报62 224206]
[27]	Xu Z Y, Liu W Q, Liu J G, He J F, Yao L, Ruan J, Chen J Y, Li Han, Yuan S, Geng H, Kan R F 2012Acta Phys.Sin. 61 234204(in Chinese)[许振宇, 刘文清, 刘建国, 何俊峰, 姚路, 阮俊, 陈玖英, 李晗, 袁松, 耿辉, 阚瑞峰2012物理学报61 234204]
[28]	Goldenstein C S, Hanson R K 2015J.Quant.Spectrosc.Radiat.Transfer 15 127
[29]	Goldenstein C S, Jeffries J B, Hanson R K 2013J.Quant.Spectrosc.Radiat.Transfer 130 100
[30]	Pogny A Klein A, Ebert V 2015J.Quant.Spectrosc.Radiat.Transfer 165 108

Cited By

[1]	Wang F, Huang Q X, Li N, Yan J H, Chi Y, Cen K F 2007Acta Phys.Sin. 56 3867(in Chinese)[王飞, 黄群星, 李宁, 严建华, 池涌, 岑可法2007物理学报56 3867]
[2]	Yury A B, Anatoliy A K, Gerard W, Frank K T, Terence H R, John D B 2008LACSEA LMB4
[3]	Rafal L, Anatoliy A K, David M T, Terence H R, Steven S, Timothy B S, Frank K T 2011SPIE 7945K1
[4]	Rothman L S, Gordon I E, Babikov Y, et al. 2013J.Quant.Spectrosc.Radiat.Transfer 130 4
[5]	Jacquinet-Husso N, Scott N A, Chdin A, et al. 2008J.Quant.Spectrosc.Radiat.Transfer 109 1043
[6]	Rothman L S, Gordon I E, Barber R J, Dothe H, Gamache R R, Goldman A, Perevalov V I, Tashkun S A, Tennyson J 2010J.Quant.Spectrosc.Radiat.Transfer 111 2139
[7]	Paldus B A, Harb C C, Spence T G, Zare R N, Gmachl C, Capasso F, Sivco D L, Baillargeon J N, Hutchinson A L, Cho A Y 2000Opt.Lett. 25 666
[8]	Manne J, Sukhorukov O, Jger W, Tulip J 2006Appl.Opt. 45 9230
[9]	O'Leary D M, Orphal J, Ruth A A, Heitmann U, Chelin P, Fellows C E 2008J.Quant.Spectrosc.Radiat.Transfer 109 1004
[10]	Barton E J, Yurchenko S N, Tennyson J, Clausen S, Fateev A 2015J.Quant.Spectrosc.Radiat.Transfer 167 126
[11]	Guinet M, Jeseck P, Mondelain D, Pepin I, Janssen C, Camy-Peyret C, Mandin J Y 2011J.Quant.Spectrosc.Radiat.Transfer 112 1950
[12]	Naumenko O V, Bguier S, Leshchishina O M, Campargue A 2010J.Quant.Spectrosc.Radiat.Transfer 111 36
[13]	Webber M E, MacDonald T, Pushkarsky M B, Patel C K N, Zhao Y, Marcillac N, Mitloehner F M 2005Meas.Sci.Technol. 16 1547
[14]	Milton B, da Marcelo G S, Marcelo S S, Delson U S, Helion V, Andras M, Peter H 2006Appl.Opt. 45 4966
[15]	Maddaloni P, Gagliardi G, Malara P, de Natale P 2005Appl.Phys.B 80 141
[16]	Tiwari V B, Singh S, Mishra S R, Rawat H S, Mehendale S C 2006Appl.Phys.B 83 93
[17]	Michael E W, Douglas S B, Ronald K H 2001Appl.Opt. 40 2031
[18]	Xu L H, Liu Z, Yakovlev I, Tretyakov M Y, Lees R M 2004Infrared Phys.Technol. 45 31
[19]	Jia H, Zhao W, Cai T, Chen W, Zhang W, Gao X 2009J.Quant.Spectrosc.Radiat.Transfer 110 347
[20]	Gibb J S, Hancock G, Peverall R, Ritchie G A D, Russell L J 2004Eur.Phys.J.D 28 59
[21]	Sur R, Spearrin R M, Peng W Y, Strand C L, Jeffries J B, Enns G M, Hanson R K 2016J.Quant.Spectrosc.Radiat.Transfer 175 90
[22]	Romh J E, Cacciani P, Taher F, Čermk P, Coslou J, Khelkhal M A 2016J.Mol.Spectrosc. 4 1
[23]	He Y, Zhang Y J, Wang L M, You K 2012Opt.Technol. 38 421(in Chinese)[何莹, 张玉钧, 王立明, 尤坤2012光学技术38 421]
[24]	Schilt S 2010Appl.Phys.B 100 1
[25]	Zhou X 2005Ph.D.Dissertation(California:Stanford University)
[26]	Chen J Y, Liu J G, He Y B, Wang L, Jiang Q, Xu Z Y, Yao L, Yuan S, Ruan J, He J F, Dai Y H, Kan R F 2013Acta Phys.Sin. 62 224206(in Chinese)[陈玖英, 刘建国, 何亚柏, 王辽, 冮强, 许振宇, 姚路, 袁松, 阮俊, 何俊峰, 戴云海, 阚瑞峰2013物理学报62 224206]
[27]	Xu Z Y, Liu W Q, Liu J G, He J F, Yao L, Ruan J, Chen J Y, Li Han, Yuan S, Geng H, Kan R F 2012Acta Phys.Sin. 61 234204(in Chinese)[许振宇, 刘文清, 刘建国, 何俊峰, 姚路, 阮俊, 陈玖英, 李晗, 袁松, 耿辉, 阚瑞峰2012物理学报61 234204]
[28]	Goldenstein C S, Hanson R K 2015J.Quant.Spectrosc.Radiat.Transfer 15 127
[29]	Goldenstein C S, Jeffries J B, Hanson R K 2013J.Quant.Spectrosc.Radiat.Transfer 130 100
[30]	Pogny A Klein A, Ebert V 2015J.Quant.Spectrosc.Radiat.Transfer 165 108

Catalog

Vol. 66, Issue 5 - 2017-03-05

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