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STUDIES OF FOURIER-TRANSFORM ANALYSIS METHOD FOR ENERGY-DEPENDENT PHOTOELEC-TRON-DIFFRACTION (Ⅰ)——THE SYSTEMS OF Se-Ni(001) AND S-Ni(001)

TANG JING-CHANG HUANG YI

STUDIES OF FOURIER-TRANSFORM ANALYSIS METHOD FOR ENERGY-DEPENDENT PHOTOELEC-TRON-DIFFRACTION (Ⅰ)——THE SYSTEMS OF Se-Ni(001) AND S-Ni(001)

TANG JING-CHANG, HUANG YI
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  • Received Date:  20 March 1984
  • Published Online:  05 February 1985

STUDIES OF FOURIER-TRANSFORM ANALYSIS METHOD FOR ENERGY-DEPENDENT PHOTOELEC-TRON-DIFFRACTION (Ⅰ)——THE SYSTEMS OF Se-Ni(001) AND S-Ni(001)

  • 1. (1)浙江大学物理系; (2)中国科学院物理研究所

Abstract: Direct Fourier-transform analysis method for energy-dependent photoelectron-dif-fraction curves of Se-Ni(001) and S-Ni(001) systems has been studied. The effect of different energy range in which Fourier-transformation was performed on △a (layer-spacing modification) was considered. The possibility that surface structure could be determined by using these △a value and FT of experimental EDPD data has been discussed.

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