Search

Article

x

留言板

尊敬的读者、作者、审稿人, 关于本刊的投稿、审稿、编辑和出版的任何问题, 您可以本页添加留言。我们将尽快给您答复。谢谢您的支持!

姓名
邮箱
手机号码
标题
留言内容
验证码

The effect of the relaxation oscillation frequency of chaotic semiconductor laser on the rate of random sequence

Xiao Bao-Jin Hou Jia-Yin Zhang Jian-Zhong Xue Lu-Gang Wang Yun-Cai

The effect of the relaxation oscillation frequency of chaotic semiconductor laser on the rate of random sequence

Xiao Bao-Jin, Hou Jia-Yin, Zhang Jian-Zhong, Xue Lu-Gang, Wang Yun-Cai
PDF
Get Citation

(PLEASE TRANSLATE TO ENGLISH

BY GOOGLE TRANSLATE IF NEEDED.)

Metrics
  • Abstract views:  2337
  • PDF Downloads:  560
  • Cited By: 0
Publishing process
  • Received Date:  08 November 2011
  • Accepted Date:  06 January 2012
  • Published Online:  05 August 2012

The effect of the relaxation oscillation frequency of chaotic semiconductor laser on the rate of random sequence

  • 1. College of Information Engineering, Taiyuan University of Technology, Taiyuan 030024, China;
  • 2. College of Physics and Optoelectronics Engineering, Taiyuan University of Technology, Taiyuan 030024, China;
  • 3. Key Laboratory of Advanced Transducers and Intelligent Control System, Ministry of Education, Taiyuan 030024, China
Fund Project:  Project supported by the Special Funds of the National Natural Science Foundation of China (Grant No. 60927007), the National Natural Science Foundation of China (Grant Nos. 60872019, 61001114), the Natural Science Foundation of Shanxi Province(Grant No. 2010021003-4), and the Top Young and Middle-aged Innovative Talents of Higher Learning Institutions of Shanxi.

Abstract: In this paper, chaotic light generated by semiconductor laser with optical feedback is employed as physical entropy source to generate high-speed random sequence. The relationship between autocorrelation coefficient of chaotic signal and run number of random sequence is analyzed. Based on the analysis, the changes of random sequence run number are further investigated at different ratios between laser relaxation oscillation frequency fr and random sequence generation rate fn. The results show that random sequence run can easily meet the requirement for run test of NIST SP800-22 when the ratio between fr and fn satisfies the equation of fr/fn=(2k+1)/4. When k in the equation is equal to 1, the maximal rate fn=4fr/3 of random sequence is obtained.

Reference (21)

Catalog

    /

    返回文章
    返回