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中国物理学会期刊
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Wang Jia-Yu, Zhao Yuan-Yang, Xu Jian-Bin, Dai Yue-Hua. Effect of defect on the programming speed of charge trapping memoriesJ. Acta Physica Sinica, 2014, 63(5): 053101. DOI: 10.7498/aps.63.053101
Citation: Wang Jia-Yu, Zhao Yuan-Yang, Xu Jian-Bin, Dai Yue-Hua. Effect of defect on the programming speed of charge trapping memoriesJ. Acta Physica Sinica, 2014, 63(5): 053101. DOI: 10.7498/aps.63.053101
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Effect of defect on the programming speed of charge trapping memories

Acta Phys. Sin., 2014, 63(5): 053101.
DOI: 10.7498/aps.63.053101
CSTR: 32037.14.aps.63.053101
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