The VMI study on branching ratio decay from Eu 6p1/28s autoionizing state

Liang Hong-Rui; Shen Li; Jing Hua; Dai Chang-Jian

doi:10.7498/aps.63.133202

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Abstract

A velocity-map-imaging (VMI) method is employed to investigate systematically the dynamical process of ejected electrons from autoionizing states of the Eu atom for the first time as far as we know. An atom is excited stepwise from the 4f76s6s8 S7/2 ground state to the 4f76s8s8 P7/2 Rydberg state via the 4f76s6p6 P5/2 intermediate state, then further excited to the 4f76p1/2(J=3)8s and 4f76p1/2(J=4)8s autoionizing states using the three-step isolated-core excitation method. According to the excitation pathways and selection rules, the value of total angular momentum of the autoionizing state can be calculated. The energy conservation and angular momentum parity conservation would enable us to determine the final states during the autoionizing process. The ejected electron, which decays from the autoionizing process, can be focused and imaged by the electron lens and the kinetic energy of it is resolved by the position sensitive detector. By combining velocity-map-imaging method with the mathematical transformation, the ejected electron energy distribution can be obtained, also the branching ratio is confirmed. Simultaneously, by tuning the wavelength of the third laser, the characteristic of the branching ratio following the variation of the photon energy, and the possibility of the population inversion have been discussed.

Keywords:

Authors and contacts

1.
School of Science, Tianjin University of Technology, Tianjin 300384, China;
2.
Key Laboratory of Display Materials and Photoelectric Devices, Ministry of Education, Tianjin 300384, China
Funds: Project supported by the National Natural Science Foundation of China (Grant No. 11174218).

References

[1]	Jones R R, Dai C J, Gallagher T F 1990 Phys. Rev. A 41 316
[2]	Lindsay M D, Dai C J, Lyons B J, Mahon C R, Gallagher T F 1994 Phys. Rev. A 50 5058
[3]	Dai C J 1995 Phys. Rev. A 52 4416
[4]	Lindsay M D, Dai C J 1992 Phys. Rev. A 46 3789
[5]	L J, Li C Q, Dai C J 2000 Chin. Phys. 9 500
[6]	Zhang Y, Dai C J 2003 Journal of Electron Spectroscopy 128 135
[7]	Li L Q, Zhou H J, Xu X Y, Huang W, Chen D Y 1992 Chin. Phys. 1 19
[8]	Zhou H J, Huang W, Xu X Y, Chen D Y 1993 Chin. Phys. 2 917
[9]	Biemont E, Quinet P, Dai Z W, Jiang Z K, Zhang Z G, Xu H L, Svanberg S 2002 J. Phys. B:At Mol. Opt. Phys. 35 4743
[10]	Bushaw B A, Nortershauser W, Blaum K, Wendtd K 2003 Spectrochim Acta Part B 58 1083
[11]	Bhattacharyya S, Souza R D, Rao P M, Razvi M A N 2003 Spectrochim Acta Part B 58 469
[12]	Bhattacharyya S, Nakhate S G, Jayasekharan T, Razvi M A N 2006 Phys. Rev. A 73 2506
[13]	Shen L, Ye S W, D C J 2012 Acta Phys. Sin. 61 063301 (in Chinese) [沈礼, 野仕伟, 戴长建 2012 物理学报 61 063301]
[14]	Xiao Y, Dai C J, Zhao H Y, Qin W J 2009 Acta Phys. Sin. 58 3071 (in Chinese)[肖颖, 戴长建, 赵洪英, 秦文杰 2009 物理学报 58 3071]
[15]	Yang J H, Wang X, Shen L, Dai C J 2013 Acta Optica Sinica 33 278 (in Chinese)[杨金红, 王曦, 沈礼, 戴长建 2013 光学学报 33 278]
[16]	Wang X, Shen L, Dai C J 2012 J. Phys. B: At Mol. Opt. Phys. 45 5001
[17]	Kachru R, Tran N H, Pillet P, Gallagher T F 1985 Phys. Rev. A 31 218
[18]	Holland D M P, Shaw D A 2011 Journal of Electron Spectroscopy and Related Phenomena 184 144
[19]	Lucchini M, Kim K, Calegari F, Kelkensberg F, Siu W, Sansone G, Vrakking M J J, Hochlaf M, Nisoli M 2012 Phys. Rev. A 86 3404
[20]	Keeffe P O, Bolognesi P, Richter R, Moise A, Ovcharenko Y, King G C, Avaldi L 2011 Phys. Rev. A 84 2020
[21]	Stodolna A S, Rouzee A, Lepine F, Cohen S, Robicheaux F, Gijsbertsen A, Jungmann J H, Bordas C, Vrakking M J J 2013 Phys. Rev. Lett. 110 3001
[22]	Dahl J E, Delmore A D 1990 Rev. Sci. Instrum. 61 607
[23]	Xie J, Dai C J, Li M 2011 J. Phys. B:At. Mol. Opt. Phys. 44 5002
[24]	Miranda D R E, Valdos B L R, Ramirez E G, Lumbreras A D, Anaya S T, Vargas D R J I, Hernandez V J J, Torres A V, Castano V M 2013 J. Europ. Opt. Soc. Rap. 8 13036
[25]	Dribinski V, Ossadtchi A, Mandelshtam V A, Reisler H 2002 Rev. Sci. Instrum. 73 2634

Cited By

[1]	Jones R R, Dai C J, Gallagher T F 1990 Phys. Rev. A 41 316
[2]	Lindsay M D, Dai C J, Lyons B J, Mahon C R, Gallagher T F 1994 Phys. Rev. A 50 5058
[3]	Dai C J 1995 Phys. Rev. A 52 4416
[4]	Lindsay M D, Dai C J 1992 Phys. Rev. A 46 3789
[5]	L J, Li C Q, Dai C J 2000 Chin. Phys. 9 500
[6]	Zhang Y, Dai C J 2003 Journal of Electron Spectroscopy 128 135
[7]	Li L Q, Zhou H J, Xu X Y, Huang W, Chen D Y 1992 Chin. Phys. 1 19
[8]	Zhou H J, Huang W, Xu X Y, Chen D Y 1993 Chin. Phys. 2 917
[9]	Biemont E, Quinet P, Dai Z W, Jiang Z K, Zhang Z G, Xu H L, Svanberg S 2002 J. Phys. B:At Mol. Opt. Phys. 35 4743
[10]	Bushaw B A, Nortershauser W, Blaum K, Wendtd K 2003 Spectrochim Acta Part B 58 1083
[11]	Bhattacharyya S, Souza R D, Rao P M, Razvi M A N 2003 Spectrochim Acta Part B 58 469
[12]	Bhattacharyya S, Nakhate S G, Jayasekharan T, Razvi M A N 2006 Phys. Rev. A 73 2506
[13]	Shen L, Ye S W, D C J 2012 Acta Phys. Sin. 61 063301 (in Chinese) [沈礼, 野仕伟, 戴长建 2012 物理学报 61 063301]
[14]	Xiao Y, Dai C J, Zhao H Y, Qin W J 2009 Acta Phys. Sin. 58 3071 (in Chinese)[肖颖, 戴长建, 赵洪英, 秦文杰 2009 物理学报 58 3071]
[15]	Yang J H, Wang X, Shen L, Dai C J 2013 Acta Optica Sinica 33 278 (in Chinese)[杨金红, 王曦, 沈礼, 戴长建 2013 光学学报 33 278]
[16]	Wang X, Shen L, Dai C J 2012 J. Phys. B: At Mol. Opt. Phys. 45 5001
[17]	Kachru R, Tran N H, Pillet P, Gallagher T F 1985 Phys. Rev. A 31 218
[18]	Holland D M P, Shaw D A 2011 Journal of Electron Spectroscopy and Related Phenomena 184 144
[19]	Lucchini M, Kim K, Calegari F, Kelkensberg F, Siu W, Sansone G, Vrakking M J J, Hochlaf M, Nisoli M 2012 Phys. Rev. A 86 3404
[20]	Keeffe P O, Bolognesi P, Richter R, Moise A, Ovcharenko Y, King G C, Avaldi L 2011 Phys. Rev. A 84 2020
[21]	Stodolna A S, Rouzee A, Lepine F, Cohen S, Robicheaux F, Gijsbertsen A, Jungmann J H, Bordas C, Vrakking M J J 2013 Phys. Rev. Lett. 110 3001
[22]	Dahl J E, Delmore A D 1990 Rev. Sci. Instrum. 61 607
[23]	Xie J, Dai C J, Li M 2011 J. Phys. B:At. Mol. Opt. Phys. 44 5002
[24]	Miranda D R E, Valdos B L R, Ramirez E G, Lumbreras A D, Anaya S T, Vargas D R J I, Hernandez V J J, Torres A V, Castano V M 2013 J. Europ. Opt. Soc. Rap. 8 13036
[25]	Dribinski V, Ossadtchi A, Mandelshtam V A, Reisler H 2002 Rev. Sci. Instrum. 73 2634

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Vol. 63, Issue 13 - 2014-07-05

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The VMI study on branching ratio decay from Eu 6p1/28s autoionizing state

1. School of Science, Tianjin University of Technology, Tianjin 300384, China;

2. Key Laboratory of Display Materials and Photoelectric Devices, Ministry of Education, Tianjin 300384, China

Received Date: 2014-01-28

Accepted Date: 2014-03-17

Available Online: 2014-07-05

Fund Project: Project supported by the National Natural Science Foundation of China (Grant No. 11174218).

Abstract: A velocity-map-imaging (VMI) method is employed to investigate systematically the dynamical process of ejected electrons from autoionizing states of the Eu atom for the first time as far as we know. An atom is excited stepwise from the 4f76s6s8 S7/2 ground state to the 4f76s8s8 P7/2 Rydberg state via the 4f76s6p6 P5/2 intermediate state, then further excited to the 4f76p1/2(J=3)8s and 4f76p1/2(J=4)8s autoionizing states using the three-step isolated-core excitation method. According to the excitation pathways and selection rules, the value of total angular momentum of the autoionizing state can be calculated. The energy conservation and angular momentum parity conservation would enable us to determine the final states during the autoionizing process. The ejected electron, which decays from the autoionizing process, can be focused and imaged by the electron lens and the kinetic energy of it is resolved by the position sensitive detector. By combining velocity-map-imaging method with the mathematical transformation, the ejected electron energy distribution can be obtained, also the branching ratio is confirmed. Simultaneously, by tuning the wavelength of the third laser, the characteristic of the branching ratio following the variation of the photon energy, and the possibility of the population inversion have been discussed.

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Reference (25)

[1]	Jones R R, Dai C J, Gallagher T F 1990 Phys. Rev. A 41 316
[2]	Lindsay M D, Dai C J, Lyons B J, Mahon C R, Gallagher T F 1994 Phys. Rev. A 50 5058
[3]	Dai C J 1995 Phys. Rev. A 52 4416
[4]	Lindsay M D, Dai C J 1992 Phys. Rev. A 46 3789
[5]	L J, Li C Q, Dai C J 2000 Chin. Phys. 9 500
[6]	Zhang Y, Dai C J 2003 Journal of Electron Spectroscopy 128 135
[7]	Li L Q, Zhou H J, Xu X Y, Huang W, Chen D Y 1992 Chin. Phys. 1 19
[8]	Zhou H J, Huang W, Xu X Y, Chen D Y 1993 Chin. Phys. 2 917
[9]	Biemont E, Quinet P, Dai Z W, Jiang Z K, Zhang Z G, Xu H L, Svanberg S 2002 J. Phys. B:At Mol. Opt. Phys. 35 4743
[10]	Bushaw B A, Nortershauser W, Blaum K, Wendtd K 2003 Spectrochim Acta Part B 58 1083
[11]	Bhattacharyya S, Souza R D, Rao P M, Razvi M A N 2003 Spectrochim Acta Part B 58 469
[12]	Bhattacharyya S, Nakhate S G, Jayasekharan T, Razvi M A N 2006 Phys. Rev. A 73 2506
[13]	Shen L, Ye S W, D C J 2012 Acta Phys. Sin. 61 063301 (in Chinese) [沈礼, 野仕伟, 戴长建 2012 物理学报 61 063301]
[14]	Xiao Y, Dai C J, Zhao H Y, Qin W J 2009 Acta Phys. Sin. 58 3071 (in Chinese)[肖颖, 戴长建, 赵洪英, 秦文杰 2009 物理学报 58 3071]
[15]	Yang J H, Wang X, Shen L, Dai C J 2013 Acta Optica Sinica 33 278 (in Chinese)[杨金红, 王曦, 沈礼, 戴长建 2013 光学学报 33 278]
[16]	Wang X, Shen L, Dai C J 2012 J. Phys. B: At Mol. Opt. Phys. 45 5001
[17]	Kachru R, Tran N H, Pillet P, Gallagher T F 1985 Phys. Rev. A 31 218
[18]	Holland D M P, Shaw D A 2011 Journal of Electron Spectroscopy and Related Phenomena 184 144
[19]	Lucchini M, Kim K, Calegari F, Kelkensberg F, Siu W, Sansone G, Vrakking M J J, Hochlaf M, Nisoli M 2012 Phys. Rev. A 86 3404
[20]	Keeffe P O, Bolognesi P, Richter R, Moise A, Ovcharenko Y, King G C, Avaldi L 2011 Phys. Rev. A 84 2020
[21]	Stodolna A S, Rouzee A, Lepine F, Cohen S, Robicheaux F, Gijsbertsen A, Jungmann J H, Bordas C, Vrakking M J J 2013 Phys. Rev. Lett. 110 3001
[22]	Dahl J E, Delmore A D 1990 Rev. Sci. Instrum. 61 607
[23]	Xie J, Dai C J, Li M 2011 J. Phys. B:At. Mol. Opt. Phys. 44 5002
[24]	Miranda D R E, Valdos B L R, Ramirez E G, Lumbreras A D, Anaya S T, Vargas D R J I, Hernandez V J J, Torres A V, Castano V M 2013 J. Europ. Opt. Soc. Rap. 8 13036
[25]	Dribinski V, Ossadtchi A, Mandelshtam V A, Reisler H 2002 Rev. Sci. Instrum. 73 2634

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