1963, 19(7): 409-424.
DOI: 10.7498/aps.19.409
CSTR: 32037.14.aps.19.409
1963, 19(7): 425-441.
DOI: 10.7498/aps.19.425
CSTR: 32037.14.aps.19.425
1963, 19(7): 442-447.
DOI: 10.7498/aps.19.442
CSTR: 32037.14.aps.19.442
THE DIFFUSION LENGTH OF MINORITY CARRIERS IN N-TYPE SILICON MEASURED WITH A SURFACE BARRIER DETECTOR
1963, 19(7): 448-455.
DOI: 10.7498/aps.19.448
CSTR: 32037.14.aps.19.448
1963, 19(7): 456-465.
DOI: 10.7498/aps.19.456
CSTR: 32037.14.aps.19.456
1963, 19(7): 466-471.
DOI: 10.7498/aps.19.466
CSTR: 32037.14.aps.19.466


