THE DIFFUSION LENGTH OF MINORITY CARRIERS IN N-TYPE SILICON MEASURED WITH A SURFACE BARRIER DETECTOR

TANG PU-SHAN; HUO MING-HSIA; CHEN TSO-YU; WANG CHU

doi:10.7498/aps.19.448

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TANG PU-SHAN, HUO MING-HSIA, CHEN TSO-YU, WANG CHU. THE DIFFUSION LENGTH OF MINORITY CARRIERS IN N-TYPE SILICON MEASURED WITH A SURFACE BARRIER DETECTORJ. Acta Physica Sinica, 1963, 19(7): 448-455. DOI: 10.7498/aps.19.448

Citation:

TANG PU-SHAN, HUO MING-HSIA, CHEN TSO-YU, WANG CHU. THE DIFFUSION LENGTH OF MINORITY CARRIERS IN N-TYPE SILICON MEASURED WITH A SURFACE BARRIER DETECTORJ. Acta Physica Sinica, 1963, 19(7): 448-455. DOI: 10.7498/aps.19.448

Citation:

TANG PU-SHAN, HUO MING-HSIA, CHEN TSO-YU, WANG CHU. THE DIFFUSION LENGTH OF MINORITY CARRIERS IN N-TYPE SILICON MEASURED WITH A SURFACE BARRIER DETECTORJ. Acta Physica Sinica, 1963, 19(7): 448-455. DOI: 10.7498/aps.19.448