MEASUREMENT OF DEEP LEVEL TRAPS IN GaAs

ZHOU BING-LIN; WANG LE; SHAO YONG-FU; CHEN QI-YU

doi:10.7498/aps.28.350

ZHOU BING-LIN, WANG LE, SHAO YONG-FU, CHEN QI-YU. MEASUREMENT OF DEEP LEVEL TRAPS IN GaAsJ. Acta Physica Sinica, 1979, 28(3): 350-357. DOI: 10.7498/aps.28.350

Citation:

ZHOU BING-LIN, WANG LE, SHAO YONG-FU, CHEN QI-YU. MEASUREMENT OF DEEP LEVEL TRAPS IN GaAsJ. Acta Physica Sinica, 1979, 28(3): 350-357. DOI: 10.7498/aps.28.350

Citation:

ZHOU BING-LIN, WANG LE, SHAO YONG-FU, CHEN QI-YU. MEASUREMENT OF DEEP LEVEL TRAPS IN GaAsJ. Acta Physica Sinica, 1979, 28(3): 350-357. DOI: 10.7498/aps.28.350