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中国物理学会期刊
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SU CHANG-HOU. A NEW MODE OF FOUR-POINT PROBE TECHNIQUE FOR THE MEASUREMENT OF SEMICONDUCTOR SHEET RESISTANCEJ. Acta Physica Sinica, 1979, 28(6): 759-772. DOI: 10.7498/aps.28.759
Citation: SU CHANG-HOU. A NEW MODE OF FOUR-POINT PROBE TECHNIQUE FOR THE MEASUREMENT OF SEMICONDUCTOR SHEET RESISTANCEJ. Acta Physica Sinica, 1979, 28(6): 759-772. DOI: 10.7498/aps.28.759
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A NEW MODE OF FOUR-POINT PROBE TECHNIQUE FOR THE MEASUREMENT OF SEMICONDUCTOR SHEET RESISTANCE

Acta Phys. Sin., 1979, 28(6): 759-772.
DOI: 10.7498/aps.28.759
CSTR: 32037.14.aps.28.759
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