XPS AND AES STUDY FOR Pd/W/Si(lll) BILAYER INTERFACE

SHI YI-SHENG; ZHAO TE-XIU; LIU HONG-TU; WANG XIAO-PING

doi:10.7498/aps.41.1849

SHI YI-SHENG, ZHAO TE-XIU, LIU HONG-TU, WANG XIAO-PING. XPS AND AES STUDY FOR Pd/W/Si(lll) BILAYER INTERFACEJ. Acta Physica Sinica, 1992, 41(11): 1849-1855. DOI: 10.7498/aps.41.1849

Citation:

SHI YI-SHENG, ZHAO TE-XIU, LIU HONG-TU, WANG XIAO-PING. XPS AND AES STUDY FOR Pd/W/Si(lll) BILAYER INTERFACEJ. Acta Physica Sinica, 1992, 41(11): 1849-1855. DOI: 10.7498/aps.41.1849

Citation:

SHI YI-SHENG, ZHAO TE-XIU, LIU HONG-TU, WANG XIAO-PING. XPS AND AES STUDY FOR Pd/W/Si(lll) BILAYER INTERFACEJ. Acta Physica Sinica, 1992, 41(11): 1849-1855. DOI: 10.7498/aps.41.1849