THIN FILM STRESS EVALUATION BY A GLANCING X-RAY BEAM

XU KE-WEI; GAO RUN-SHENG; YU LI-GEN; HE JIA-WEN

doi:10.7498/aps.43.1295

XU KE-WEI, GAO RUN-SHENG, YU LI-GEN, HE JIA-WEN. THIN FILM STRESS EVALUATION BY A GLANCING X-RAY BEAMJ. Acta Physica Sinica, 1994, 43(8): 1295-1300. DOI: 10.7498/aps.43.1295

Citation:

XU KE-WEI, GAO RUN-SHENG, YU LI-GEN, HE JIA-WEN. THIN FILM STRESS EVALUATION BY A GLANCING X-RAY BEAMJ. Acta Physica Sinica, 1994, 43(8): 1295-1300. DOI: 10.7498/aps.43.1295

Citation:

XU KE-WEI, GAO RUN-SHENG, YU LI-GEN, HE JIA-WEN. THIN FILM STRESS EVALUATION BY A GLANCING X-RAY BEAMJ. Acta Physica Sinica, 1994, 43(8): 1295-1300. DOI: 10.7498/aps.43.1295