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中国物理学会期刊
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LUO JIAN, YAN HONG, TAO KUN. X-RAY DIFFRACTION PHASE DEPTH PROFILING FOR POLYCRYSTAL WITH CONTINUOUS PHASE DEPTH DISTRIBUTIONJ. Acta Physica Sinica, 1995, 44(11): 1788-1792. DOI: 10.7498/aps.44.1788
Citation: LUO JIAN, YAN HONG, TAO KUN. X-RAY DIFFRACTION PHASE DEPTH PROFILING FOR POLYCRYSTAL WITH CONTINUOUS PHASE DEPTH DISTRIBUTIONJ. Acta Physica Sinica, 1995, 44(11): 1788-1792. DOI: 10.7498/aps.44.1788
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X-RAY DIFFRACTION PHASE DEPTH PROFILING FOR POLYCRYSTAL WITH CONTINUOUS PHASE DEPTH DISTRIBUTION

Acta Phys. Sin., 1995, 44(11): 1788-1792.
DOI: 10.7498/aps.44.1788
CSTR: 32037.14.aps.44.1788
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