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中国物理学会期刊
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GUO LI-XIN, WU ZHEN-SEN. FRACTAL CHARACTERISTICS INVESTIGATION ON ELECTROMAGNETIC SCATTERING FROM 2D CONDUCTING ROUGH SURFACEJ. Acta Physica Sinica, 2000, 49(6): 1064-1069. DOI: 10.7498/aps.49.1064
Citation: GUO LI-XIN, WU ZHEN-SEN. FRACTAL CHARACTERISTICS INVESTIGATION ON ELECTROMAGNETIC SCATTERING FROM 2D CONDUCTING ROUGH SURFACEJ. Acta Physica Sinica, 2000, 49(6): 1064-1069. DOI: 10.7498/aps.49.1064
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FRACTAL CHARACTERISTICS INVESTIGATION ON ELECTROMAGNETIC SCATTERING FROM 2D CONDUCTING ROUGH SURFACE

Acta Phys. Sin., 2000, 49(6): 1064-1069.
DOI: 10.7498/aps.49.1064
CSTR: 32037.14.aps.49.1064
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