2000, 49(6): 1023-1027.
DOI: 10.7498/aps.49.1023
CSTR: 32037.14.aps.49.1023
2000, 49(6): 1028-1030.
DOI: 10.7498/aps.49.1028
CSTR: 32037.14.aps.49.1028
2000, 49(6): 1031-1034.
DOI: 10.7498/aps.49.1031
CSTR: 32037.14.aps.49.1031
2000, 49(6): 1035-1038.
DOI: 10.7498/aps.49.1035
CSTR: 32037.14.aps.49.1035
2000, 49(6): 1039-1042.
DOI: 10.7498/aps.49.1039
CSTR: 32037.14.aps.49.1039
2000, 49(6): 1043-1046.
DOI: 10.7498/aps.49.1043
CSTR: 32037.14.aps.49.1043
2000, 49(6): 1047-1051.
DOI: 10.7498/aps.49.1047
CSTR: 32037.14.aps.49.1047
2000, 49(6): 1052-1057.
DOI: 10.7498/aps.49.1052
CSTR: 32037.14.aps.49.1052
2000, 49(6): 1058-1063.
DOI: 10.7498/aps.49.1058
CSTR: 32037.14.aps.49.1058
FRACTAL CHARACTERISTICS INVESTIGATION ON ELECTROMAGNETIC SCATTERING FROM 2D CONDUCTING ROUGH SURFACE
2000, 49(6): 1064-1069.
DOI: 10.7498/aps.49.1064
CSTR: 32037.14.aps.49.1064
2000, 49(6): 1070-1075.
DOI: 10.7498/aps.49.1070
CSTR: 32037.14.aps.49.1070
2000, 49(6): 1076-1080.
DOI: 10.7498/aps.49.1076
CSTR: 32037.14.aps.49.1076
2000, 49(6): 1081-1085.
DOI: 10.7498/aps.49.1081
CSTR: 32037.14.aps.49.1081
2000, 49(6): 1086-1090.
DOI: 10.7498/aps.49.1086
CSTR: 32037.14.aps.49.1086
2000, 49(6): 1091-1093.
DOI: 10.7498/aps.49.1091
CSTR: 32037.14.aps.49.1091
2000, 49(6): 1094-1100.
DOI: 10.7498/aps.49.1094
CSTR: 32037.14.aps.49.1094
2000, 49(6): 1101-1105.
DOI: 10.7498/aps.49.1101
CSTR: 32037.14.aps.49.1101
2000, 49(6): 1106-1108.
DOI: 10.7498/aps.49.1106
CSTR: 32037.14.aps.49.1106
2000, 49(6): 1109-1113.
DOI: 10.7498/aps.49.1109
CSTR: 32037.14.aps.49.1109
2000, 49(6): 1120-1123.
DOI: 10.7498/aps.49.1120
CSTR: 32037.14.aps.49.1120
2000, 49(6): 1124-1131.
DOI: 10.7498/aps.49.1124
CSTR: 32037.14.aps.49.1124
2000, 49(6): 1132-1135.
DOI: 10.7498/aps.49.1132
CSTR: 32037.14.aps.49.1132
2000, 49(6): 1136-1139.
DOI: 10.7498/aps.49.1136
CSTR: 32037.14.aps.49.1136
2000, 49(6): 1140-1143.
DOI: 10.7498/aps.49.1140
CSTR: 32037.14.aps.49.1140
2000, 49(6): 1144-1147.
DOI: 10.7498/aps.49.1144
CSTR: 32037.14.aps.49.1144
2000, 49(6): 1148-1152.
DOI: 10.7498/aps.49.1148
CSTR: 32037.14.aps.49.1148
2000, 49(6): 1153-1158.
DOI: 10.7498/aps.49.1153
CSTR: 32037.14.aps.49.1153
2000, 49(6): 1163-1167.
DOI: 10.7498/aps.49.1163
CSTR: 32037.14.aps.49.1163
2000, 49(6): 1168-1170.
DOI: 10.7498/aps.49.1168
CSTR: 32037.14.aps.49.1168
2000, 49(6): 1171-1175.
DOI: 10.7498/aps.49.1171
CSTR: 32037.14.aps.49.1171
2000, 49(6): 1176-1179.
DOI: 10.7498/aps.49.1176
CSTR: 32037.14.aps.49.1176
2000, 49(6): 1180-1184.
DOI: 10.7498/aps.49.1180
CSTR: 32037.14.aps.49.1180
2000, 49(6): 1191-1195.
DOI: 10.7498/aps.49.1191
CSTR: 32037.14.aps.49.1191
2000, 49(6): 1196-1201.
DOI: 10.7498/aps.49.1196
CSTR: 32037.14.aps.49.1196
2000, 49(6): 1202-1205.
DOI: 10.7498/aps.49.1202
CSTR: 32037.14.aps.49.1202


