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中国物理学会期刊
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LIU HONG-XIA, HAO YUE. STUDY ON PARAMETER CHARACTERIZATION OF THIN GATE OXIDE TDDB BREAKDOWNJ. Acta Physica Sinica, 2000, 49(6): 1163-1167. DOI: 10.7498/aps.49.1163
Citation: LIU HONG-XIA, HAO YUE. STUDY ON PARAMETER CHARACTERIZATION OF THIN GATE OXIDE TDDB BREAKDOWNJ. Acta Physica Sinica, 2000, 49(6): 1163-1167. DOI: 10.7498/aps.49.1163
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STUDY ON PARAMETER CHARACTERIZATION OF THIN GATE OXIDE TDDB BREAKDOWN

Acta Phys. Sin., 2000, 49(6): 1163-1167.
DOI: 10.7498/aps.49.1163
CSTR: 32037.14.aps.49.1163
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