Measurement of electronic transport property of semiconductors by three-dimensional modulated free carrier absorption technique

Zhang Xi-Ren; Li Bin-Cheng; Liu Xian-Ming

doi:10.7498/aps.57.7310

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Zhang Xi-Ren, Li Bin-Cheng, Liu Xian-Ming. Measurement of electronic transport property of semiconductors by three-dimensional modulated free carrier absorption techniqueJ. Acta Physica Sinica, 2008, 57(11): 7310-7316. DOI: 10.7498/aps.57.7310

Citation:

Zhang Xi-Ren, Li Bin-Cheng, Liu Xian-Ming. Measurement of electronic transport property of semiconductors by three-dimensional modulated free carrier absorption techniqueJ. Acta Physica Sinica, 2008, 57(11): 7310-7316. DOI: 10.7498/aps.57.7310

Citation:

Zhang Xi-Ren, Li Bin-Cheng, Liu Xian-Ming. Measurement of electronic transport property of semiconductors by three-dimensional modulated free carrier absorption techniqueJ. Acta Physica Sinica, 2008, 57(11): 7310-7316. DOI: 10.7498/aps.57.7310