2008, 57(11): 6689-6693.
DOI: 10.7498/aps.57.6689
CSTR: 32037.14.aps.57.6689
2008, 57(11): 6694-6698.
DOI: 10.7498/aps.57.6694
CSTR: 32037.14.aps.57.6694
2008, 57(11): 6699-6703.
DOI: 10.7498/aps.57.6699
CSTR: 32037.14.aps.57.6699
2008, 57(11): 6704-6708.
DOI: 10.7498/aps.57.6704
CSTR: 32037.14.aps.57.6704
2008, 57(11): 6709-6713.
DOI: 10.7498/aps.57.6709
CSTR: 32037.14.aps.57.6709
2008, 57(11): 6714-6717.
DOI: 10.7498/aps.57.6714
CSTR: 32037.14.aps.57.6714
2008, 57(11): 6718-6721.
DOI: 10.7498/aps.57.6718
CSTR: 32037.14.aps.57.6718
2008, 57(11): 6722-6729.
DOI: 10.7498/aps.57.6722
CSTR: 32037.14.aps.57.6722
2008, 57(11): 6736-6740.
DOI: 10.7498/aps.57.6736
CSTR: 32037.14.aps.57.6736
2008, 57(11): 6751-6757.
DOI: 10.7498/aps.57.6751
CSTR: 32037.14.aps.57.6751
2008, 57(11): 6758-6762.
DOI: 10.7498/aps.57.6758
CSTR: 32037.14.aps.57.6758
2008, 57(11): 6763-6770.
DOI: 10.7498/aps.57.6763
CSTR: 32037.14.aps.57.6763
2008, 57(11): 6771-6776.
DOI: 10.7498/aps.57.6771
CSTR: 32037.14.aps.57.6771
2008, 57(11): 6777-6785.
DOI: 10.7498/aps.57.6777
CSTR: 32037.14.aps.57.6777
2008, 57(11): 6786-6791.
DOI: 10.7498/aps.57.6786
CSTR: 32037.14.aps.57.6786
2008, 57(11): 6792-6798.
DOI: 10.7498/aps.57.6792
CSTR: 32037.14.aps.57.6792
2008, 57(11): 6799-6807.
DOI: 10.7498/aps.57.6799
CSTR: 32037.14.aps.57.6799
2008, 57(11): 6808-6814.
DOI: 10.7498/aps.57.6808
CSTR: 32037.14.aps.57.6808
2008, 57(11): 6815-6823.
DOI: 10.7498/aps.57.6815
CSTR: 32037.14.aps.57.6815
A new approach to synchronization between two different chaotic systems with parametric perturbation
2008, 57(11): 6824-6829.
DOI: 10.7498/aps.57.6824
CSTR: 32037.14.aps.57.6824
2008, 57(11): 6830-6836.
DOI: 10.7498/aps.57.6830
CSTR: 32037.14.aps.57.6830
2008, 57(11): 6837-6843.
DOI: 10.7498/aps.57.6837
CSTR: 32037.14.aps.57.6837
2008, 57(11): 6844-6851.
DOI: 10.7498/aps.57.6844
CSTR: 32037.14.aps.57.6844
2008, 57(11): 6852-6858.
DOI: 10.7498/aps.57.6852
CSTR: 32037.14.aps.57.6852
2008, 57(11): 6859-6867.
DOI: 10.7498/aps.57.6859
CSTR: 32037.14.aps.57.6859
2008, 57(11): 6868-6877.
DOI: 10.7498/aps.57.6868
CSTR: 32037.14.aps.57.6868
2008, 57(11): 6878-6882.
DOI: 10.7498/aps.57.6878
CSTR: 32037.14.aps.57.6878
2008, 57(11): 6883-6887.
DOI: 10.7498/aps.57.6883
CSTR: 32037.14.aps.57.6883
2008, 57(11): 6888-6895.
DOI: 10.7498/aps.57.6888
CSTR: 32037.14.aps.57.6888
2008, 57(11): 6896-6900.
DOI: 10.7498/aps.57.6896
CSTR: 32037.14.aps.57.6896
2008, 57(11): 6901-6908.
DOI: 10.7498/aps.57.6901
CSTR: 32037.14.aps.57.6901
2008, 57(11): 6909-6920.
DOI: 10.7498/aps.57.6909
CSTR: 32037.14.aps.57.6909
2008, 57(11): 6921-6925.
DOI: 10.7498/aps.57.6921
CSTR: 32037.14.aps.57.6921
2008, 57(11): 6926-6931.
DOI: 10.7498/aps.57.6926
CSTR: 32037.14.aps.57.6926
2008, 57(11): 6932-6938.
DOI: 10.7498/aps.57.6932
CSTR: 32037.14.aps.57.6932
2008, 57(11): 6939-6945.
DOI: 10.7498/aps.57.6939
CSTR: 32037.14.aps.57.6939
2008, 57(11): 6946-6954.
DOI: 10.7498/aps.57.6946
CSTR: 32037.14.aps.57.6946
2008, 57(11): 6955-6961.
DOI: 10.7498/aps.57.6955
CSTR: 32037.14.aps.57.6955
2008, 57(11): 6968-6975.
DOI: 10.7498/aps.57.6968
CSTR: 32037.14.aps.57.6968
2008, 57(11): 6976-6981.
DOI: 10.7498/aps.57.6976
CSTR: 32037.14.aps.57.6976
2008, 57(11): 6982-6986.
DOI: 10.7498/aps.57.6982
CSTR: 32037.14.aps.57.6982
2008, 57(11): 6987-6991.
DOI: 10.7498/aps.57.6987
CSTR: 32037.14.aps.57.6987
2008, 57(11): 6992-6997.
DOI: 10.7498/aps.57.6992
CSTR: 32037.14.aps.57.6992
2008, 57(11): 6998-7004.
DOI: 10.7498/aps.57.6998
CSTR: 32037.14.aps.57.6998
2008, 57(11): 7005-7011.
DOI: 10.7498/aps.57.7005
CSTR: 32037.14.aps.57.7005
2008, 57(11): 7017-7021.
DOI: 10.7498/aps.57.7017
CSTR: 32037.14.aps.57.7017
2008, 57(11): 7022-7029.
DOI: 10.7498/aps.57.7022
CSTR: 32037.14.aps.57.7022
2008, 57(11): 7030-7037.
DOI: 10.7498/aps.57.7030
CSTR: 32037.14.aps.57.7030
2008, 57(11): 7038-7043.
DOI: 10.7498/aps.57.7038
CSTR: 32037.14.aps.57.7038
2008, 57(11): 7052-7056.
DOI: 10.7498/aps.57.7052
CSTR: 32037.14.aps.57.7052
2008, 57(11): 7057-7062.
DOI: 10.7498/aps.57.7057
CSTR: 32037.14.aps.57.7057
2008, 57(11): 7063-7068.
DOI: 10.7498/aps.57.7063
CSTR: 32037.14.aps.57.7063
2008, 57(11): 7069-7077.
DOI: 10.7498/aps.57.7069
CSTR: 32037.14.aps.57.7069
2008, 57(11): 7078-7082.
DOI: 10.7498/aps.57.7078
CSTR: 32037.14.aps.57.7078
2008, 57(11): 7088-7093.
DOI: 10.7498/aps.57.7088
CSTR: 32037.14.aps.57.7088
The deformation mechanism of nanofilm with void under tensile loading: An atomistic simulation study
2008, 57(11): 7094-7099.
DOI: 10.7498/aps.57.7094
CSTR: 32037.14.aps.57.7094
2008, 57(11): 7100-7107.
DOI: 10.7498/aps.57.7100
CSTR: 32037.14.aps.57.7100
2008, 57(11): 7108-7113.
DOI: 10.7498/aps.57.7108
CSTR: 32037.14.aps.57.7108
2008, 57(11): 7114-7118.
DOI: 10.7498/aps.57.7114
CSTR: 32037.14.aps.57.7114
2008, 57(11): 7119-7125.
DOI: 10.7498/aps.57.7119
CSTR: 32037.14.aps.57.7119
2008, 57(11): 7126-7131.
DOI: 10.7498/aps.57.7126
CSTR: 32037.14.aps.57.7126
2008, 57(11): 7132-7138.
DOI: 10.7498/aps.57.7132
CSTR: 32037.14.aps.57.7132
2008, 57(11): 7139-7144.
DOI: 10.7498/aps.57.7139
CSTR: 32037.14.aps.57.7139
2008, 57(11): 7145-7150.
DOI: 10.7498/aps.57.7145
CSTR: 32037.14.aps.57.7145
2008, 57(11): 7151-7156.
DOI: 10.7498/aps.57.7151
CSTR: 32037.14.aps.57.7151
2008, 57(11): 7157-7163.
DOI: 10.7498/aps.57.7157
CSTR: 32037.14.aps.57.7157
2008, 57(11): 7164-7167.
DOI: 10.7498/aps.57.7164
CSTR: 32037.14.aps.57.7164
2008, 57(11): 7168-7172.
DOI: 10.7498/aps.57.7168
CSTR: 32037.14.aps.57.7168
2008, 57(11): 7173-7177.
DOI: 10.7498/aps.57.7173
CSTR: 32037.14.aps.57.7173
2008, 57(11): 7178-7184.
DOI: 10.7498/aps.57.7178
CSTR: 32037.14.aps.57.7178
2008, 57(11): 7185-7189.
DOI: 10.7498/aps.57.7185
CSTR: 32037.14.aps.57.7185
2008, 57(11): 7190-7193.
DOI: 10.7498/aps.57.7190
CSTR: 32037.14.aps.57.7190
2008, 57(11): 7194-7199.
DOI: 10.7498/aps.57.7194
CSTR: 32037.14.aps.57.7194
2008, 57(11): 7200-7203.
DOI: 10.7498/aps.57.7200
CSTR: 32037.14.aps.57.7200
2008, 57(11): 7204-7209.
DOI: 10.7498/aps.57.7204
CSTR: 32037.14.aps.57.7204
2008, 57(11): 7210-7215.
DOI: 10.7498/aps.57.7210
CSTR: 32037.14.aps.57.7210
2008, 57(11): 7216-7220.
DOI: 10.7498/aps.57.7216
CSTR: 32037.14.aps.57.7216
2008, 57(11): 7221-7227.
DOI: 10.7498/aps.57.7221
CSTR: 32037.14.aps.57.7221
2008, 57(11): 7228-7232.
DOI: 10.7498/aps.57.7228
CSTR: 32037.14.aps.57.7228
2008, 57(11): 7233-7237.
DOI: 10.7498/aps.57.7233
CSTR: 32037.14.aps.57.7233
Study on doping and electrical properties of organic infrared semiconductor phthalocyanine erbium(Ⅲ)
2008, 57(11): 7244-7251.
DOI: 10.7498/aps.57.7244
CSTR: 32037.14.aps.57.7244
2008, 57(11): 7252-7256.
DOI: 10.7498/aps.57.7252
CSTR: 32037.14.aps.57.7252
2008, 57(11): 7257-7261.
DOI: 10.7498/aps.57.7257
CSTR: 32037.14.aps.57.7257
2008, 57(11): 7262-7266.
DOI: 10.7498/aps.57.7262
CSTR: 32037.14.aps.57.7262
2008, 57(11): 7267-7273.
DOI: 10.7498/aps.57.7267
CSTR: 32037.14.aps.57.7267
2008, 57(11): 7274-7278.
DOI: 10.7498/aps.57.7274
CSTR: 32037.14.aps.57.7274
2008, 57(11): 7279-7286.
DOI: 10.7498/aps.57.7279
CSTR: 32037.14.aps.57.7279
2008, 57(11): 7287-7291.
DOI: 10.7498/aps.57.7287
CSTR: 32037.14.aps.57.7287
2008, 57(11): 7292-7297.
DOI: 10.7498/aps.57.7292
CSTR: 32037.14.aps.57.7292
2008, 57(11): 7298-7304.
DOI: 10.7498/aps.57.7298
CSTR: 32037.14.aps.57.7298
2008, 57(11): 7305-7309.
DOI: 10.7498/aps.57.7305
CSTR: 32037.14.aps.57.7305
2008, 57(11): 7317-7321.
DOI: 10.7498/aps.57.7317
CSTR: 32037.14.aps.57.7317
2008, 57(11): 7327-7332.
DOI: 10.7498/aps.57.7327
CSTR: 32037.14.aps.57.7327
2008, 57(11): 7333-7337.
DOI: 10.7498/aps.57.7333
CSTR: 32037.14.aps.57.7333
2008, 57(11): 7338-7343.
DOI: 10.7498/aps.57.7338
CSTR: 32037.14.aps.57.7338
2008, 57(11): 7344-7348.
DOI: 10.7498/aps.57.7344
CSTR: 32037.14.aps.57.7344
2008, 57(11): 7349-7353.
DOI: 10.7498/aps.57.7349
CSTR: 32037.14.aps.57.7349
2008, 57(11): 7354-7359.
DOI: 10.7498/aps.57.7354
CSTR: 32037.14.aps.57.7354
2008, 57(11): 7360-7366.
DOI: 10.7498/aps.57.7360
CSTR: 32037.14.aps.57.7360
2008, 57(11): 7367-7373.
DOI: 10.7498/aps.57.7367
CSTR: 32037.14.aps.57.7367
2008, 57(11): 7374-7379.
DOI: 10.7498/aps.57.7374
CSTR: 32037.14.aps.57.7374
2008, 57(11): 7380-7389.
DOI: 10.7498/aps.57.7380
CSTR: 32037.14.aps.57.7380
2008, 57(11): 7390-7395.
DOI: 10.7498/aps.57.7390
CSTR: 32037.14.aps.57.7390
2008, 57(11): 7396-7407.
DOI: 10.7498/aps.57.7396
CSTR: 32037.14.aps.57.7396
2008, 57(11): 7408-7414.
DOI: 10.7498/aps.57.7408
CSTR: 32037.14.aps.57.7408


