Total ionizing dose effects of <b>γ</b> and X-rays on 55 nm silicon-oxide-nitride-oxide-silicon single flash memory cell

Cao Yang; Xi Kai; Xu Yan-Nan; Li Mei; Li Bo; Bi Jin-Shun; Liu Ming

doi:10.7498/aps.68.20181661

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Cao Yang, Xi Kai, Xu Yan-Nan, Li Mei, Li Bo, Bi Jin-Shun, Liu Ming. Total ionizing dose effects of γ and X-rays on 55 nm silicon-oxide-nitride-oxide-silicon single flash memory cellJ. Acta Physica Sinica, 2019, 68(3): 038501. DOI: 10.7498/aps.68.20181661

Citation:

Cao Yang, Xi Kai, Xu Yan-Nan, Li Mei, Li Bo, Bi Jin-Shun, Liu Ming. Total ionizing dose effects of γ and X-rays on 55 nm silicon-oxide-nitride-oxide-silicon single flash memory cellJ. Acta Physica Sinica, 2019, 68(3): 038501. DOI: 10.7498/aps.68.20181661

Citation:

Cao Yang, Xi Kai, Xu Yan-Nan, Li Mei, Li Bo, Bi Jin-Shun, Liu Ming. Total ionizing dose effects of γ and X-rays on 55 nm silicon-oxide-nitride-oxide-silicon single flash memory cellJ. Acta Physica Sinica, 2019, 68(3): 038501. DOI: 10.7498/aps.68.20181661