Research on Single Event Burnout of GaN power devices with femtosecond pulsed laser

Cui Yi-Xin; Ma Ying-Qi; Shangguan Shi-Peng; Kang Xuan-Wu; Liu Peng-Cheng; Han Jian-Wei

doi:10.7498/aps.71.20212297

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Cui Yi-Xin, Ma Ying-Qi, Shangguan Shi-Peng, Kang Xuan-Wu, Liu Peng-Cheng, Han Jian-Wei. Research on Single Event Burnout of GaN power devices with femtosecond pulsed laserJ. Acta Physica Sinica, 2022, 71(13): 136102. DOI: 10.7498/aps.71.20212297

Citation:

Cui Yi-Xin, Ma Ying-Qi, Shangguan Shi-Peng, Kang Xuan-Wu, Liu Peng-Cheng, Han Jian-Wei. Research on Single Event Burnout of GaN power devices with femtosecond pulsed laserJ. Acta Physica Sinica, 2022, 71(13): 136102. DOI: 10.7498/aps.71.20212297

Citation:

Cui Yi-Xin, Ma Ying-Qi, Shangguan Shi-Peng, Kang Xuan-Wu, Liu Peng-Cheng, Han Jian-Wei. Research on Single Event Burnout of GaN power devices with femtosecond pulsed laserJ. Acta Physica Sinica, 2022, 71(13): 136102. DOI: 10.7498/aps.71.20212297