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中国物理学会期刊
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XIN Xiankun, WU Wei. Finite-temperature-criticality enhanced quantum metrology. Acta Physica Sinica, 2026, 75(17): 170601. DOI: 10.7498/aps.75.20260624
Citation: XIN Xiankun, WU Wei. Finite-temperature-criticality enhanced quantum metrology. Acta Physica Sinica, 2026, 75(17): 170601. DOI: 10.7498/aps.75.20260624
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Finite-temperature-criticality enhanced quantum metrology

Acta Phys. Sin., 2026, 75(17): 170601.
DOI: 10.7498/aps.75.20260624
CSTR: 32037.14.aps.75.20260624
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