| [1] |
Hua Ying-Xin, Chen Xiao-Hui, Li Jun, Hao Long, Sun Yi, Wang Yu-Feng, Geng Hua-Yun. In situ X-ray diffraction measurement of shock melting in vanadium. Acta Physica Sinica,
2022, 71(7): 076201.
doi: 10.7498/aps.71.20212065
|
| [2] |
Wang Bi-Han, Li Bing, Liu Xu-Qiang, Wang Hao, Jiang Sheng, Lin Chuan-Long, Yang Wen-Ge. Millisecond time-resolved synchrotron radiation X-ray diffraction and high-pressure rapid compression device and its application. Acta Physica Sinica,
2022, 71(10): 100702.
doi: 10.7498/aps.71.20212360
|
| [3] |
Yang Jun-Liang, Li Zhong-Liang, Li Tang, Zhu Ye, Song Li, Xue Lian, Zhang Xiao-Wei. Characteristics of multi-crystals monfiguration X-ray diffraction and application in characterizing synchrotron beamline bandwidth. Acta Physica Sinica,
2020, 69(10): 104101.
doi: 10.7498/aps.69.20200165
|
| [4] |
Fan Jia-Dong, Jiang Huai-Dong. Coherent X-ray diffraction imaging and its applications in materials science and biology. Acta Physica Sinica,
2012, 61(21): 218702.
doi: 10.7498/aps.61.218702
|
| [5] |
Li Hong-Tao, Luo Yi, Xi Guang-Yi, Wang Lai, Jiang Yang, Zhao Wei, Han Yan-Jun, Hao Zhi-Biao, Sun Chang-Zheng. Thickness measurement of GaN films by X-ray diffraction. Acta Physica Sinica,
2008, 57(11): 7119-7125.
doi: 10.7498/aps.57.7119
|
| [6] |
WANG YU-TIAN, ZHUANG YAN, JIANG DE-SHENG, YANG XIAO-PING, JIANG XIAO-MING, WU JIA-YANG, XIU LI-SONG, ZHENG WEN-LI. STUDY OF DOUBLE-BARRIER SUPERLATTICE BY SYNCHROTRON RADIATION AND DOUBLE-CRYSTAL X-RAY DIFFRACTION. Acta Physica Sinica,
1996, 45(10): 1709-1716.
doi: 10.7498/aps.45.1709
|
| [7] |
PENG LIAN-MAO, REN GANG. THE ANALYTIC DOYLE-TURNER REPRESENTATION OF HIGH ENERGY ELECTRON ABSORPTIVE STRUCTURE FACTORS. Acta Physica Sinica,
1996, 45(8): 1344-1349.
doi: 10.7498/aps.45.1344
|
| [8] |
HE XIAN-CHANG, WU ZI-QIN, ZHAO TE-XIU, Lü ZHI-HUI, WANG XIAO-PING, SUN GUO-XI. INVESTIGATION OF LATTICE DEFORMATION OF POROUS SILICON FILMS BY X-RAY DOUBLE CRYSTAL DIFFRACTION. Acta Physica Sinica,
1993, 42(6): 954-962.
doi: 10.7498/aps.42.954
|
| [9] |
LI JIAN-HUA, MAI ZHEN-HONG, CUI SHU-FAN. X-RAY DOUBLE-CRYSTAL DIFFRACTION AND TOPOGRAPHY STUDY OF STRAIN RELAXED InGaAs/GaAs SUPERLATTICES. Acta Physica Sinica,
1993, 42(9): 1485-1490.
doi: 10.7498/aps.42.1485
|
| [10] |
YANG PING. BEHAVIOUR OF X-RAY DIFFRACTION FROM UNIFORMLY BENT Si CRYSTAL. Acta Physica Sinica,
1992, 41(2): 267-271.
doi: 10.7498/aps.41.267
|
| [11] |
MAI ZHEN-HONG, GUI SHU-FAN, WANG CHAO-YING, WU LAN-SHENG. STUDY OF AlGaAs/GaAs WAVEGUIDE STRUCTURE BY X-RAY DOUBLE CRYSTAL DIFFRACTION. Acta Physica Sinica,
1991, 40(6): 969-977.
doi: 10.7498/aps.40.969
|
| [12] |
ZHU NAN-CHANG, LI RUN-SHEN, CHEN JING-YI, XU SHUN-SHENG. INVESTIGATION OF THE SURFACE DISTORTED CRYSTALS BY DYNAMICAL X-RAY DOUBLE-CRYSTAL DIFFRACTION. Acta Physica Sinica,
1990, 39(5): 770-777.
doi: 10.7498/aps.39.770
|
| [13] |
ZHANG JIAN-ZHONG, CAO YAN-NI. SIMULATION STUDY OF DIVERGENT BEAM X-RAY DIFFRACTION BY CRYSTALS. Acta Physica Sinica,
1990, 39(1): 124-128.
doi: 10.7498/aps.39.124
|
| [14] |
MA DE-LU, SHANG DE-YING, YU JIN-HUA. XRD STUDY OF N2+ IMPLANTED Si. Acta Physica Sinica,
1989, 38(4): 579-585.
doi: 10.7498/aps.38.579
|
| [15] |
JIANG XIAO-MING, WU ZI-QIN, QIAN LIN-ZHAO. X-RAY HUANG DIFFUSE SCATTERING FROM DEFECTS IN γ IRRADIATED LiF CRYSTAL. Acta Physica Sinica,
1989, 38(4): 529-533.
doi: 10.7498/aps.38.529
|
| [16] |
JIANG XIAO-MING, WU ZI-QIN. SIMULATION OF X-RAY DIFFRACTION PEAK PROFILE OF ONE DIMENSIONAL FIBONACCI SERIES. Acta Physica Sinica,
1988, 37(11): 1900-1905.
doi: 10.7498/aps.37.1900
|
| [17] |
SUN ZhANG-DE. SOLVING THE EQUATION OF X-RAY DIFFRACTION BY GREEN'S FUNCTION. Acta Physica Sinica,
1983, 32(8): 982-989.
doi: 10.7498/aps.32.982
|
| [18] |
XU JI-AN, HU JING-ZHU. X-RAY DIFFRACTION UNDER HIGH PRESSURE. Acta Physica Sinica,
1977, 26(6): 521-525.
doi: 10.7498/aps.26.521
|
| [19] |
SHAW NAN, LIU YI-HUAN. X-RAY MEASUREMENT OF THE THERMAL EXPANSION OF GERMANIUM, SILICON, INDIUM ANTIMONIDE AND GALLIUM ARSENIDE. Acta Physica Sinica,
1964, 20(8): 699-704.
doi: 10.7498/aps.20.699
|
| [20] |
CHEN CHI. THE INFLUENCE OF WORKING CONDITIONS OF X-RAY DIFFRACTOMETER ON THE POSITION OF THE CENTRE OF GRAVITY,THE MEAN-SQUARE WIDTH AND THE PROFILE OF INTERFERENCE LINES. Acta Physica Sinica,
1961, 17(10): 465-481.
doi: 10.7498/aps.17.465
|
下载:
