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中国物理学会期刊
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Ji Ting-Wei, Bai Gang. Effect of biaxial misfit strain on properties of ferroelectric double gate negative capacitance transistorsJ. Acta Physica Sinica, 2023, 72(6): 067701. DOI: 10.7498/aps.72.20222190
Citation: Ji Ting-Wei, Bai Gang. Effect of biaxial misfit strain on properties of ferroelectric double gate negative capacitance transistorsJ. Acta Physica Sinica, 2023, 72(6): 067701. DOI: 10.7498/aps.72.20222190
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Effect of biaxial misfit strain on properties of ferroelectric double gate negative capacitance transistors

Acta Phys. Sin., 2023, 72(6): 067701.
DOI: 10.7498/aps.72.20222190
CSTR: 32037.14.aps.72.20222190
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