Study of the proton irradiation damage on Capsule type polarization-maintaining optical fibers made in China

Zhang Hong-Chen; Liu Hai; Qiao Wen-Qiang; Li Xing-Ji; He Shi-Yu; V. V. Abraimof

doi:10.7498/aps.61.034213

Abstract

A spacecraft running in the space environment would be irradiated by the proton, and the irradiation effects on the most important parts of the optical fiber gyroscope in the spacecraft -the optical fiber ring is the most. In order to investigate the irradiation damage induced by proton irradiation on the Capsule type polarization-maintaining optical fibers made in china, the variation of the transportation power at 1310 nm wavelength is measured by means of situ measurement for the 5 MeV and 10 MeV environments protons irradiation on the Capsule type polarization-maintaining optical fibers made in china. The irradiation induced loss is calculated by us. The Stopping and Range of Ions in Matter (SRIM) software was used to simulate the ionic and displacement damage of 5 MeV and 10 MeV energy protons irradiation on the optical fibers. The O 1s and Si 2p analytic spectrum of the before and after irradiation were obtained by means of X ray photoelectron spectroscopy (XPS). Using the Fourier transform infrared spectrometer (FTIR), we analyzed the before and after irradiation spectrum. The results show that at the 1310 nm wavelength, the rradiation induced loss of the of optical fibers increase with the increasing of the protons fluence due to the increase of the SiOH concentration in optical fiber core. The 5 MeV proton irradiation induced loss is worse than that of the 10 MeV mainly because the more worse displacement and the ironic damage induced by 5 MeV proton at the position of the optical fiber core than that of 10 MeV, i.e., the more amount of SiOH generation.

Keywords:

Capsuletype polarization-maintaining optical fibers /
proton irradiation induced loss /
XPS /
FTIR

Authors and contacts

1.
Space Material and Environment Engineering Laboratory, Harbin Institute of Technology, Harbin 150001, China

References

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[25]	Dan S, Adelina S 2007 Fusion Engineering and Design 82 1372
[26]	Fatma I, Nur A A L, David A B, Andrew N 2011 Nucl. Instr. Meth. Phys. Res. A 652 834
[27]	Alessi A, Girard S, Marcandella C, Agnello S, Cannas M, Boukenter A, Ouerdane Y 2011 Optics Express 19 11680
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[29]	Henschel H, Köhn O, Weinand U 2002 IEEE Trans. Nucl. Sci. 49 1432
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[33]	Lim T Y, Kim C Y, Kim B S 2004 J. Sol-Gel Sci. Tech. 31 263
[34]	Cho S M, Kim Y T, Yoon D H 2003 J. Korean Phys. Soc. 42 S947
[35]	Lin Y J, Lee H Y, Hwang F T, Lee C T 2001 J. Electron. Mater. 30 532
[36]	Lin Y J, Lin W X, Lee C T, Chang H C 2006 Jpn. J. Appl. Phys. 45 2505
[37]	Lee S H, Jeong S, Moon J 2009 Organic Electronics 10 982
[38]	Kim D I, Kim K H, Ahn H S 2010 International J. Precision Engineering and Manufacturing 11 741
[39]	Innocenzi P, Falcaro P, Grosso D, Babonneau F 2003 J. Phys. Chem. B 107 4711
[40]	Zhang G Q, Xua D P, Song G X, Xue Y F, Li L, Wang D Y, Su W H 2009 J. Alloys and Compounds 476 L4
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Cited By

[1]	Klaus B, Hubert B, Martin G B, Philippe G, Peter G 2007 IEEE Trans. Indust. Appl. 43 180
[2]	Li M C, Liu L H, Xiao T P, Xue J J, Liang L T, Wang H L, Xiong M 2006 Appl. Phys. Lett. 89 101101-1
[3]	Sagnac G 1913 Comptes rendus de I’ academie des Sciences 95 708
[4]	Ezekiel S, Arditty H J 1982 Springer Series in Optical Sciences 32 2–26
[5]	Miyamaru H, Tanabe T, Iida T, Takahashi A 1996 Nucl. Instr. Meth. Phys. Res. B 116 393
[6]	Wang Q Y, Geng H B, He S Y, Yang D Z, Zhang Z H, Qin X B, Li Z X 2009 Nucl. Instr. Meth. Phys. Res. B 267 2489
[7]	Wu Y Y, Yue L, Hu J M, Lan M J, Xiao J D, Yang D Z, He S Y, Zhang Z W, Wang X C, Qian Y, Chen M B 2011 Acta Phys. Sin 60 098110 (in Chinese)[吴宜勇, 岳龙, 胡建民, 蓝慕杰, 肖景东, 杨德庄, 何世禹, 张忠卫, 王训春, 钱勇, 陈鸣波 2011 物理学报 60 098110]
[8]	Maurer R D, Schiel E J, Kronenberg S, Lux R A 1973 Appl. Opt. 12 2024
[9]	Friebele E 1979 J. Optical Engineering 18 552
[10]	Tortech B 2008 IEEE Trans. Nucl. Sci. 55 2223
[11]	Hashim S, Bradley D A, Peng N, Ramli A T, Wagiran H 2010 Nucl. Instr. Meth. Phys. Res. A 619 291
[12]	Alessi A, Girard S, Marcandella C, Agnello S, Cannas M, Boukenter A, Ouerdane Y 2011 J. Non-Crystalline Solids 357 1966
[13]	Yaakob N H 2011 Appl. Radiation and Isotopes 69 1189
[14]	Mahrenia A, Mohamada A B, Kadhuma A A H, Dauda W R W, Iyukeb S E 2009 J. Membrane Science 327 32
[15]	Shah L H, Tsuchiya B, Nagata S, Shikama T 2011 J. Nuclear Materials 417 822
[16]	Girard S, Tortech B, Régnier E, Van M, Gusarov A, Ouerdane Y, Baggio J, Paillet P, Ferle C V, Boukenter A, Meunier J P, Berghmans F, Schwank J R, Shaneyfelt M R, Felix J A, Blackmore EW, Thienpont H 2007 IEEE Trans. Nucl. Sci. 54 2426
[17]	Tchebotareva A L, Brebner J L, Roorda S, Albert J 1999 Nucl. Instr. Meth. Phys. Res. B 148 687
[18]	Seung J Y, Masahiro S, Yoshimichi O, Makoto F, Kouichi A, Eisuke Y, Satoshi O 2007 Nucl. Instr. Meth. Phys. Res. B 265 490
[19]	Kamala S K, Lahti D G, Smith W D, Averett T M 1996 SPIE. Photonics for Space Environments 2811 95
[20]	Yaakob N H,Wagiran H, Hossain I, Ramli A T, Bradley D A 2011 Nucl. Instr. Meth. Phys. Res. A 637 185
[21]	Hashim S, Ali H 2011 Nucl. Instr. Meth. Phys. Res. A 637 185
[22]	Fabrizio M, Francesco C, Marco Cannas 2011 J. Non-Crystalline Solids 357 1985
[23]	Paul M C, Bohra D, Dhar A, Sen R, Bhatnagar P K, Dasgupta K 2009 J. Non-Crystalline Solids 355 1496
[24]	Jiang H, Chen B X, Sui G R, Ji S 2010 Acta Phys. Sin. 59 7782 (in Chinese)[姜辉, 陈抱雪, 傅长松, 隋国荣, 矶守 2010 物理学报 59 7782]
[25]	Dan S, Adelina S 2007 Fusion Engineering and Design 82 1372
[26]	Fatma I, Nur A A L, David A B, Andrew N 2011 Nucl. Instr. Meth. Phys. Res. A 652 834
[27]	Alessi A, Girard S, Marcandella C, Agnello S, Cannas M, Boukenter A, Ouerdane Y 2011 Optics Express 19 11680
[28]	Komeda M, Kumada H, Ishikawa M, Nakamura T, Yamamoto K, Matsumura A 2009 Appl. Radiation and Isotopes 67 S254
[29]	Henschel H, Köhn O, Weinand U 2002 IEEE Trans. Nucl. Sci. 49 1432
[30]	David L G 2004 J. Non-Crystalline Solids 349 139
[31]	Abdulrahman M, Alhazmi, Paul M M 2009 J. Am. Soc. Mass. Spectrom 20 6
[32]	Kudoh H, Kasai N, Sasuga T, Seguchi T 1996 Radlat. Phys. Chem. 48 95
[33]	Lim T Y, Kim C Y, Kim B S 2004 J. Sol-Gel Sci. Tech. 31 263
[34]	Cho S M, Kim Y T, Yoon D H 2003 J. Korean Phys. Soc. 42 S947
[35]	Lin Y J, Lee H Y, Hwang F T, Lee C T 2001 J. Electron. Mater. 30 532
[36]	Lin Y J, Lin W X, Lee C T, Chang H C 2006 Jpn. J. Appl. Phys. 45 2505
[37]	Lee S H, Jeong S, Moon J 2009 Organic Electronics 10 982
[38]	Kim D I, Kim K H, Ahn H S 2010 International J. Precision Engineering and Manufacturing 11 741
[39]	Innocenzi P, Falcaro P, Grosso D, Babonneau F 2003 J. Phys. Chem. B 107 4711
[40]	Zhang G Q, Xua D P, Song G X, Xue Y F, Li L, Wang D Y, Su W H 2009 J. Alloys and Compounds 476 L4
[41]	Cannas M, Costa S Boscaino R, Gelardi F M 2004 J. Non-Cryst. Solids 337 9
[42]	Feng M, Li Y G, Li J F, Li J, Zhang X G, Lu K C, Wang H J 2005 Chin. Phys. Lett. 22 1137

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Vol. 61, Issue 3 - 2012-02-05

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