The damage effect and mechanism of the bipolar transistor induced by different types of high power microwaves
Acta Physica Sinica
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Acta Phys. Sin  2013, Vol. 62 Issue (12): 128501     doi:10.7498/aps.62.128501
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The damage effect and mechanism of the bipolar transistor induced by different types of high power microwaves
Ma Zhen-Yang, Chai Chang-Chun, Ren Xing-Rong, Yang Yin-Tang, Qiao Li-Ping, Shi Chun-Lei
Key Laboratory of Ministry of Education for Wide Band-Gap, Semiconductor Materials and Devices, School of Microelectronics, Xidian University, Xi’an 710071 China
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