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A NEW DEVELOPMENT IN THE REAL SPACE HIGH RESOLU-TION ELECTRON MICROSCOPE SIMULATION METHOD

WANG YUAN-MING CHEN JIANG-HUA HU TIAN-BAO

A NEW DEVELOPMENT IN THE REAL SPACE HIGH RESOLU-TION ELECTRON MICROSCOPE SIMULATION METHOD

WANG YUAN-MING, CHEN JIANG-HUA, HU TIAN-BAO
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  • Received Date:  07 November 1988
  • Published Online:  08 July 2005

A NEW DEVELOPMENT IN THE REAL SPACE HIGH RESOLU-TION ELECTRON MICROSCOPE SIMULATION METHOD

  • 1. 中国科学院金属研究所固体原子象实验室

Abstract: In a detailed study of the problem of induced numerical artifacts in the Real Space (RS) High Resolution Electron Microscopy (HREM) image simulation, a δ-ε criterion in the RS method for simulating HREM images has been derived. This condition imposes a practical limitation in choosing the sampling interval δ and the slice thickness ε for the RS method. It has been found that when the δ-ε condition is satisfied and a much more accurate formula is used for calculating the propagating factor p(r), the RS method gives results in satisfactory agreement with the conventional FFT multi-slice (FFTMS) method, but saving coputational time and avoiding the computing divergence that may arise in the RS method.

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