Search

Article

x

留言板

尊敬的读者、作者、审稿人, 关于本刊的投稿、审稿、编辑和出版的任何问题, 您可以本页添加留言。我们将尽快给您答复。谢谢您的支持!

姓名
邮箱
手机号码
标题
留言内容
验证码

Photoionization of Ne and Xe atoms induced by extreme ultraviolet photons

Lei Jian-Ting Yu Xuan Shi Guo-Qiang Yan Shun-Cheng Sun Shao-Hua Wang Quan-Jun Ding Bao-Wei Ma Xin-Wen Zhang Shao-Feng Ding Jing-Jie

Citation:

Photoionization of Ne and Xe atoms induced by extreme ultraviolet photons

Lei Jian-Ting, Yu Xuan, Shi Guo-Qiang, Yan Shun-Cheng, Sun Shao-Hua, Wang Quan-Jun, Ding Bao-Wei, Ma Xin-Wen, Zhang Shao-Feng, Ding Jing-Jie
PDF
HTML
Get Citation
  • The interaction of extreme ultraviolet (XUV) photon with matter is a meaningful way to understand the electronic structure of microscopic particles. In this paper, the electron angular distributions of single ionization and double ionization of Ne and Xe atoms interacting with XUV photons are investigated by utilizing a reaction microscope. The β-asymmetric parameters of 2p electrons of Ne atom, and 5p, 5s electrons of Xe atom combined with the reported experimental data are compared with those from different theoretical models. The result shows that the electron correlation effect can be ignored in the ionization of 2p electron of Ne atom. While the ionization of 5p electron of Xe atom is strongly influenced by the electron correlation effect, but not by the relativistic effect. These two effects play an important role in ionizing the 5s shell of Xe atom. In addition, this study finds that both direct double ionization and indirect double ionization exist simultaneously during the ionization of Xe atom, and gives the photoelectron angular distributions and the β-asymmetric parameters of the first step and the second step of indirect double ionization.
      Corresponding author: Ding Jing-Jie, dingjj@lzu.edu.cn
    • Funds: Project supported by the National Natural Science Foundation of China (Grant Nos. 11905083, U1932133).
    [1]

    Leuchs G 1984 Multiphoton Processes Berlin, Heidelberg, September 5−12, 1984 pp48−57

    [2]

    L'Huillier A, Lompre L A, Mainfray G, Manus C 1983 Phys. Rev. A 27 2503Google Scholar

    [3]

    Weber T, Giessen H, Weckenbrock M, Urbasch G, Staudte A 2000 Nature 405 658Google Scholar

    [4]

    Imanaka H, Smith M A 2007 Geophys. Res. Lett. 34 L02204Google Scholar

    [5]

    Hell N, Brown G V, Wilms J, Grinberg V, Clementson J, Liedahl D, Porter F S, Kelley R L, Kilbourne C A, Beiersdorfer P 2016 Astrophys. J. 830 26Google Scholar

    [6]

    Cooper J W, Fano U, Prats F 1963 Phys. Rev. Lett. 10 518Google Scholar

    [7]

    Madden R P, Codling K 1963 Phys. Rev. Lett. 10 516Google Scholar

    [8]

    Wuilleumier F, Krause M O 1974 Phys. Rev. A 10 242Google Scholar

    [9]

    Becker U, Langer B, Kerkhoff H G, Kupsch M, Szostak D, Wehlitz R, Heimann P A, Liu S H, Lindle D W, Ferrett T A, Shirley D A 1988 Phys. Rev. Lett. 60 1490Google Scholar

    [10]

    Richter M, Bobashev S V, Sorokin A A, Tiedtke K 2010 J. Phys. B:At. Mol. Opt. Phys. 43 194005Google Scholar

    [11]

    Bolognesi P, Cavanagh S J, Avaldi L, Camilloni R, Zitnik M, Stuhec M, King G C 2000 J. Phys. B:At. Mol. Opt. Phys. 33 4723Google Scholar

    [12]

    Hall R I, Ellis K, Mcconkey A, Dawber G, Avaldi L, Macdonald M A, King G C 1992 J. Phys. B:At. Mol. Opt. Phys. 23 377Google Scholar

    [13]

    Fano U, Cooper J W 1968 Rev. Mod. Phys. 40 441Google Scholar

    [14]

    Wuilleumier F, Adam M Y, Dhez P, Sandner N, Schmidt V, Mehlhorn W 1977 Phys. Rev. A 16 646Google Scholar

    [15]

    Johnson W R, Cheng K T 1978 Phys. Rev. Lett. 40 1167Google Scholar

    [16]

    Hemmers O, Whitfield S B, Glans P, Wang H, Lindle D W, Wehlitz R, Sellin I A 1998 Rev. Sci. Instrum. 69 3809Google Scholar

    [17]

    Schwarzkopf O, Krässig B, Elmiger J, Schmidt V 1993 Phys. Rev. Lett. 70 3008Google Scholar

    [18]

    Ueda K, Shimizu Y, Chiba H, Kitajima M, Okamoto M, Hoshino M, Tanaka H, Hayaishi T, Fritzsche S, Sazhina I P, Kabachnik N M 2003 J. Phys. B: At. Mol. Opt. Phys. 36 319Google Scholar

    [19]

    Dörner R, Vogt T, Mergel V, et al. 1996 Phys. Rev. Lett. 76 2654Google Scholar

    [20]

    Czasch A, Schöffler M, Hattass M, et al. 2005 Phys. Rev. Lett. 95 243003Google Scholar

    [21]

    Weber T, Weckenbrock M, Staudte A, Hattass M, Spielberger L, Jagutzki O, Mergel V, Böcking H S, Urbasch G, Giessen H, Bräuning H, Cocke C L, Prior M H, Dörner R 2001 Opt. Express 8 368Google Scholar

    [22]

    Dörner R, Mergel V, Jagutzki O, Spielberger L, Ullrich J, Moshammer R, Schmidtböcking H 2000 Phys. Rep. 330 95Google Scholar

    [23]

    Hai B, Zhang S F, Zhang M, Najjari B, Dong D P, Lei J T, Zhao D M, Ma X 2020 Phys. Rev. A 101 052706Google Scholar

    [24]

    Gagnon E, Sandhu A S, Paul A, Hagen K, Czasch A, Jahnke T, Ranitovic P, Lewis Cocke C, Walker B, Murnane M M, Kapteyn H C 2008 Rev. Sci. Instrum. 79 063102Google Scholar

    [25]

    Wiley W C, Mclaren I H 1955 Rev. Sci. Instrum. 26 1150Google Scholar

    [26]

    Codling K, Houlgate R G, West J B, Woodruff P R 1976 J. Phys. B:At. Mol. Phys. 9 L83Google Scholar

    [27]

    Dehmer J L, Chupka W A, Berkowitz J, Jivery W T 1975 Phys. Rev. A 12 1966Google Scholar

    [28]

    Schmidt V 1986 Photoionization in Rare Gases with Synchrotron Radiation: Some Basic Aspects for Critical Tests with Theory (Vol. 2) pp275−283

    [29]

    Amusia M Y, Cherepkov N A, Chernysheva L V 1972 Phys. Rev. A 40 15Google Scholar

    [30]

    Lagutin B M, Petrov I D, Sukhorukov V L, Whitfield S B, Langer B, Viefhaus J, Wehlitz R, Berrah N, Mahler W, Becker U 1996 J. Phys. B:At. Mol. Opt. Phys. 29 937Google Scholar

    [31]

    Samson J, Stolte W C 2002 J. Electron Spectrosc. Relat. Phenom. 123 265Google Scholar

    [32]

    Qiao C K, Chi H C, Hsu M C, Zheng X G, Jiang G, Lin S T, Tang C J, Huang K N 2019 J. Phys. B: At. Mol. Opt. Phys. 52 075001Google Scholar

    [33]

    Fahlman A, Carlson T A, Krause M O 1983 Phys. Rev. Lett. 50 1114Google Scholar

    [34]

    Samson J A R, Gardner J L 1974 Phys. Rev. Lett. 33 671Google Scholar

    [35]

    Krause M O, Carlson T A, Woodruff P R 1981 Phys. Rev. A 24 1374Google Scholar

    [36]

    Johnson W R, Cheng K T 1979 Phys. Rev. A 20 978Google Scholar

    [37]

    Johnson W R, Cheng K T 2001 Phys. Rev. A 63 022504Google Scholar

    [38]

    White M G, Southworth S H, Kobrin P, Poliakoff E D, Rosenberg R A, Shirley D A 1979 Phys. Rev. Lett. 43 1661Google Scholar

    [39]

    Dehmer J L, Dill D 1976 Phys. Rev. Lett. 37 1049Google Scholar

    [40]

    Eland J H D, Vieuxmaire O, Kinugawa T, Lablanquie P, Hall R I, Penent F 2003 Phys. Rev. Lett. 90 053003Google Scholar

  • 图 1  实验装置示意图

    Figure 1.  Schematic diagram of the experimental setup.

    图 2  (a) Ne原子光电子的能谱; (b) 光电子动量在y-z平面内的二维动量分布图, 统计动量$ \left|{P}_{x}\right| < 0.1 $的事件; (c) 2p电子的角分布; (d) 2p电子的β不对称参数随光子能量的变化关系

    Figure 2.  (a) Energy spectrum of the photoelectron from Ne; (b) density plots of the momentum distribution of the photoelectron on the y-z plane for events with transverse momentum $ \left|{P}_{x}\right| < 0.1 $; (c) angular distribution of 2p electrons; (d) the β-asymmetric parameter for 2p photoionization as a function of the photon energy.

    图 3  (a) 入射光子能量为38.8 eV时, Xe原子单电离的出射光电子能谱; (b) Xe原子单电离出射光电子在y-z平面内的二维动量分布

    Figure 3.  (a) Photoelectron energy spectrum for Xe with 38.8 eV XUV photon; (b) photoelectron momentum distribution of Xe on the y-z plane defined by the XUV polarization.

    图 4  (a), (c) 分别为Xe原子5p电子与5s电子电离的角分布图; (b), (d) 分别为5p电子与5s电子对应的β不对称参数随入射光子能量的变化

    Figure 4.  (a), (c) Angular distribution of the 5p and 5s photoelectrons of Xe, respectively; (b), (d) β-asymmetric parameter of 5p and 5s electron varies with the photon energy, respectively.

    图 5  (a) 在38.8 eV XUV光的作用下, Xe原子双电离对应的反应路径; (b) Xe原子单光子双电离的电子能谱; (c) 光电子能量在0−1.5 eV 内的电子角分布; (d) 5.5−7.0 eV 能量的光电子角分布

    Figure 5.  (a) Typical routes to double ionization of Xe interacting with 38.8 eV XUV photon; (b) kinetic energy distribution of photoelectrons from double ionization of Xe; (c) angular distributions of the photoelectrons energy in the range of 0–1.5 eV; (d) angular distributions of the photoelectrons energy in the range of 5.5–7.0 eV.

    表 1  Xe原子不同电子组态及结合能

    Table 1.  Different electronic configurations and binding energies of Xe atoms.

    Xe+电子组态总角动量J能量/eV能峰序号
    5p5P3/212.10(1)
    P1/213.40(2)
    5s5p6S1/223.30(3)
    5s25p4 (3P)6p2D3/227.54(4)
    5s25p4 (3P)5d2D5/2
    5s25p4 (1D)5d2P1/227.88
    5s25p4 (1D)5d2D3/227.97
    5s25p4 (1S)6s2S1/228.16
    DownLoad: CSV
  • [1]

    Leuchs G 1984 Multiphoton Processes Berlin, Heidelberg, September 5−12, 1984 pp48−57

    [2]

    L'Huillier A, Lompre L A, Mainfray G, Manus C 1983 Phys. Rev. A 27 2503Google Scholar

    [3]

    Weber T, Giessen H, Weckenbrock M, Urbasch G, Staudte A 2000 Nature 405 658Google Scholar

    [4]

    Imanaka H, Smith M A 2007 Geophys. Res. Lett. 34 L02204Google Scholar

    [5]

    Hell N, Brown G V, Wilms J, Grinberg V, Clementson J, Liedahl D, Porter F S, Kelley R L, Kilbourne C A, Beiersdorfer P 2016 Astrophys. J. 830 26Google Scholar

    [6]

    Cooper J W, Fano U, Prats F 1963 Phys. Rev. Lett. 10 518Google Scholar

    [7]

    Madden R P, Codling K 1963 Phys. Rev. Lett. 10 516Google Scholar

    [8]

    Wuilleumier F, Krause M O 1974 Phys. Rev. A 10 242Google Scholar

    [9]

    Becker U, Langer B, Kerkhoff H G, Kupsch M, Szostak D, Wehlitz R, Heimann P A, Liu S H, Lindle D W, Ferrett T A, Shirley D A 1988 Phys. Rev. Lett. 60 1490Google Scholar

    [10]

    Richter M, Bobashev S V, Sorokin A A, Tiedtke K 2010 J. Phys. B:At. Mol. Opt. Phys. 43 194005Google Scholar

    [11]

    Bolognesi P, Cavanagh S J, Avaldi L, Camilloni R, Zitnik M, Stuhec M, King G C 2000 J. Phys. B:At. Mol. Opt. Phys. 33 4723Google Scholar

    [12]

    Hall R I, Ellis K, Mcconkey A, Dawber G, Avaldi L, Macdonald M A, King G C 1992 J. Phys. B:At. Mol. Opt. Phys. 23 377Google Scholar

    [13]

    Fano U, Cooper J W 1968 Rev. Mod. Phys. 40 441Google Scholar

    [14]

    Wuilleumier F, Adam M Y, Dhez P, Sandner N, Schmidt V, Mehlhorn W 1977 Phys. Rev. A 16 646Google Scholar

    [15]

    Johnson W R, Cheng K T 1978 Phys. Rev. Lett. 40 1167Google Scholar

    [16]

    Hemmers O, Whitfield S B, Glans P, Wang H, Lindle D W, Wehlitz R, Sellin I A 1998 Rev. Sci. Instrum. 69 3809Google Scholar

    [17]

    Schwarzkopf O, Krässig B, Elmiger J, Schmidt V 1993 Phys. Rev. Lett. 70 3008Google Scholar

    [18]

    Ueda K, Shimizu Y, Chiba H, Kitajima M, Okamoto M, Hoshino M, Tanaka H, Hayaishi T, Fritzsche S, Sazhina I P, Kabachnik N M 2003 J. Phys. B: At. Mol. Opt. Phys. 36 319Google Scholar

    [19]

    Dörner R, Vogt T, Mergel V, et al. 1996 Phys. Rev. Lett. 76 2654Google Scholar

    [20]

    Czasch A, Schöffler M, Hattass M, et al. 2005 Phys. Rev. Lett. 95 243003Google Scholar

    [21]

    Weber T, Weckenbrock M, Staudte A, Hattass M, Spielberger L, Jagutzki O, Mergel V, Böcking H S, Urbasch G, Giessen H, Bräuning H, Cocke C L, Prior M H, Dörner R 2001 Opt. Express 8 368Google Scholar

    [22]

    Dörner R, Mergel V, Jagutzki O, Spielberger L, Ullrich J, Moshammer R, Schmidtböcking H 2000 Phys. Rep. 330 95Google Scholar

    [23]

    Hai B, Zhang S F, Zhang M, Najjari B, Dong D P, Lei J T, Zhao D M, Ma X 2020 Phys. Rev. A 101 052706Google Scholar

    [24]

    Gagnon E, Sandhu A S, Paul A, Hagen K, Czasch A, Jahnke T, Ranitovic P, Lewis Cocke C, Walker B, Murnane M M, Kapteyn H C 2008 Rev. Sci. Instrum. 79 063102Google Scholar

    [25]

    Wiley W C, Mclaren I H 1955 Rev. Sci. Instrum. 26 1150Google Scholar

    [26]

    Codling K, Houlgate R G, West J B, Woodruff P R 1976 J. Phys. B:At. Mol. Phys. 9 L83Google Scholar

    [27]

    Dehmer J L, Chupka W A, Berkowitz J, Jivery W T 1975 Phys. Rev. A 12 1966Google Scholar

    [28]

    Schmidt V 1986 Photoionization in Rare Gases with Synchrotron Radiation: Some Basic Aspects for Critical Tests with Theory (Vol. 2) pp275−283

    [29]

    Amusia M Y, Cherepkov N A, Chernysheva L V 1972 Phys. Rev. A 40 15Google Scholar

    [30]

    Lagutin B M, Petrov I D, Sukhorukov V L, Whitfield S B, Langer B, Viefhaus J, Wehlitz R, Berrah N, Mahler W, Becker U 1996 J. Phys. B:At. Mol. Opt. Phys. 29 937Google Scholar

    [31]

    Samson J, Stolte W C 2002 J. Electron Spectrosc. Relat. Phenom. 123 265Google Scholar

    [32]

    Qiao C K, Chi H C, Hsu M C, Zheng X G, Jiang G, Lin S T, Tang C J, Huang K N 2019 J. Phys. B: At. Mol. Opt. Phys. 52 075001Google Scholar

    [33]

    Fahlman A, Carlson T A, Krause M O 1983 Phys. Rev. Lett. 50 1114Google Scholar

    [34]

    Samson J A R, Gardner J L 1974 Phys. Rev. Lett. 33 671Google Scholar

    [35]

    Krause M O, Carlson T A, Woodruff P R 1981 Phys. Rev. A 24 1374Google Scholar

    [36]

    Johnson W R, Cheng K T 1979 Phys. Rev. A 20 978Google Scholar

    [37]

    Johnson W R, Cheng K T 2001 Phys. Rev. A 63 022504Google Scholar

    [38]

    White M G, Southworth S H, Kobrin P, Poliakoff E D, Rosenberg R A, Shirley D A 1979 Phys. Rev. Lett. 43 1661Google Scholar

    [39]

    Dehmer J L, Dill D 1976 Phys. Rev. Lett. 37 1049Google Scholar

    [40]

    Eland J H D, Vieuxmaire O, Kinugawa T, Lablanquie P, Hall R I, Penent F 2003 Phys. Rev. Lett. 90 053003Google Scholar

  • [1] Zhao Wei-Kuan, Zhang Ling, Cheng Yun-Xin, Zhou Cheng-Xi, Zhang Wen-Min, Duan Yan-Min, Hu Ai-Lan, Wang Shou-Xin, Zhang Feng-Ling, Li Zheng-Wei, Cao Yi-Ming, Liu Hai-Qing. Experimental study on up-down asymmetry of tungsten impurities in EAST tokamak. Acta Physica Sinica, 2024, 73(3): 035201. doi: 10.7498/aps.73.20231448
    [2] Wang Jun-Wu, Xuan Hong-Wen, Yu Hang-Hang, Wang Xin-Bing, Vassily S. Zakharov. Simulation of extreme ultraviolet radiation of laser induced discharge plasma. Acta Physica Sinica, 2024, 73(1): 015203. doi: 10.7498/aps.73.20231158
    [3] Luo Yan, Yu Xuan, Lei Jian-Ting, Tao Chen-Yu, Zhang Shao-Feng, Zhu Xiao-Long, Ma Xin-Wen, Yan Shun-Cheng, Zhao Xiao-Hui. Fragmentation mechanism of methane dehydrogenation channel induced by extreme ultraviolet and high charge ions. Acta Physica Sinica, 2024, 73(4): 044101. doi: 10.7498/aps.73.20231377
    [4] Ma Kun, Zhu Lin-Fan, Xie Lu-You. Non-dipole effects on angular distribution of photoelectrons in sequential two-photon double ionization of Ar atom and K+ ion. Acta Physica Sinica, 2022, 71(6): 063201. doi: 10.7498/aps.71.20211905
    [5] Ma Kun, Xie Lu-You, Dong Chen-Zhong. Theoretical calculations on photoelectron angular distribution of sequential two-photon double ionization for Ar atom. Acta Physica Sinica, 2020, 69(5): 053201. doi: 10.7498/aps.69.20191814
    [6] Ma Kun, Xie Lu-You, Zhang Deng-Hong, Jiang Jun, Dong Chen-Zhong. Non-dipole effects in the angular distributions of photoelectrons on sodium-like ions. Acta Physica Sinica, 2017, 66(4): 043201. doi: 10.7498/aps.66.043201
    [7] Ma Kun, Xie Lu-You, Zhang Deng-Hong, Dong Chen-Zhong, Qu Yi-Zhi. Theoretical calculation of the photoelectron angular distribution of neon. Acta Physica Sinica, 2016, 65(8): 083201. doi: 10.7498/aps.65.083201
    [8] Zhang Han-Jun, Shan Xu, Xu Chun-Kai, Chen Xiang-Jun. Triple differential cross section for the ionization of Ar(3p) by low-energy electron impact in the coplanar asymmetric geometry. Acta Physica Sinica, 2013, 62(18): 183401. doi: 10.7498/aps.62.183401
    [9] Dou Wei-Dong, Song Fei, Huang Han, Bao Shi-Ning, Chen Qiao. UPS study of electronic states of CuPc/Ag(110). Acta Physica Sinica, 2008, 57(1): 628-633. doi: 10.7498/aps.57.628
    [10] Cai Yi, Wang Wen-Tao, Yang Ming, Liu Jian-Sheng, Lu Pei-Xiang, Li Ru-Xin, Xu Zhi-Zhan. Experimental study on extreme ultraviolet light generation from high power laser-irradiated tin slab. Acta Physica Sinica, 2008, 57(8): 5100-5104. doi: 10.7498/aps.57.5100
    [11] Lu Yun-Hao, Duan Xiao-Bang, Lü Ping, Zhang Han-Jie, Li Hai-Yang, Bao Shi-Ning, He Pi-Mo. UPS study of tri(β-naphthyl) phosphine overlayer on Ag(110). Acta Physica Sinica, 2005, 54(9): 4319-4323. doi: 10.7498/aps.54.4319
    [12] Lv Bin, Lv Ping, Shi Shen-Lei, Zhang Jian-Hua, Tang Jian-Xin, Lou Hui, He Pi-Mo, Bao Shi-Ning. . Acta Physica Sinica, 2002, 51(11): 2644-2648. doi: 10.7498/aps.51.2644
    [13] Jin Kui-Juan, Pan Shao-Hua, Yang Guo-Zheng. . Acta Physica Sinica, 1995, 44(2): 299-304. doi: 10.7498/aps.44.299
    [14] BAO SHI-NING, XU RONG, LI HAI-YANG, ZHU LI, XU CHUN-YI, XU YA-BO. ARUPS STUDY OF THE COADSORPTION OF CO AND K ON Cu(111). Acta Physica Sinica, 1992, 41(3): 523-527. doi: 10.7498/aps.41.523
    [15] BAO SHI-NINO, ZHU LI, XU YA-BO. ARUPS INVESTIGATION OF CO COADSORPTION WITH K ON W(100) SURFACE. Acta Physica Sinica, 1991, 40(11): 1888-1892. doi: 10.7498/aps.40.1888
    [16] BAO SHI-NING, ZHU LI, XU YA-BO, LI ZHUO-ZHI. ANGLE-RESOLVED UPS INVESTIGATION OF COADSORPITON OF CO AND K ON Fe(110) SURFACE. Acta Physica Sinica, 1990, 39(8): 169-174. doi: 10.7498/aps.39.169-3
    [17] LU XUE-KUN, HOU XIAO-YUAN, CING XUN-MIN, CHEN PING. GaP BAND STRUCTURE STUDIED BY ARUPS. Acta Physica Sinica, 1990, 39(8): 108-114. doi: 10.7498/aps.39.108
    [18] WU BAI-MEI, CHEN ZHAO-JIA, BAO SHI-NING, BAO DE-SONG, JI ZHEN-GUO, LIU GU. UPS STUDIES OF Nb-Ni GLASSES DURING CRYSTALLIZATION. Acta Physica Sinica, 1989, 38(4): 675-678. doi: 10.7498/aps.38.675
    [19] PAN SHI-HONG, MO DANG, K. K. CHYN, W. E. SPICER. A STUDY ON VALENCE-BAND PHOTOEMISSION SPECTRA OF NOBLE METAL-GaAs(110) INTERFACES. Acta Physica Sinica, 1987, 36(10): 1255-1263. doi: 10.7498/aps.36.1255
    [20] Zhang Fang-qing, Xu Xi-xiang, Chen Guang-hua, Jiang Zhi-chen, Chen Zhen-shi, Qi Shang-kui. STUDY OF VALENCE-BAND PROPERTIES IN a-Si1-xCx:H BY UV PHOTO-ELECTRON SPECTROSOPY. Acta Physica Sinica, 1986, 35(9): 1253-1258. doi: 10.7498/aps.35.1253
Metrics
  • Abstract views:  3772
  • PDF Downloads:  147
  • Cited By: 0
Publishing process
  • Received Date:  25 February 2022
  • Accepted Date:  23 March 2022
  • Available Online:  15 June 2022
  • Published Online:  20 July 2022

/

返回文章
返回