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A MODIFIED WARREN-AVERBACH METHOD FOR THE SAMPLE WITH A MICRO-STRAIN GRADIENT IN ITS SURFACE LAYER

## A MODIFIED WARREN-AVERBACH METHOD FOR THE SAMPLE WITH A MICRO-STRAIN GRADIENT IN ITS SURFACE LAYER

YANG LIU, YAO HONG-NIAN
• #### Abstract

This paper deals with X-ray diffraction profile analysis for the sample with a micro-strain gradient in its surface layer. On the assumption that the variation of micro-strain L2> with depth t is expressed as L2>-Σam(L)tm, Warren-Averbach method is modified so that it can be used in this case. For the special case of L2>=α0+a1(L)t, the relationship between the micro-strain L2> and the depth t can be determined by analyses of diffraction profiles belonging to two different radiations.

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•  Citation:
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• Abstract views:  2784
• Cited By: 0
##### Publishing process
• Received Date:  24 December 1987
• Published Online:  08 July 2005

## A MODIFIED WARREN-AVERBACH METHOD FOR THE SAMPLE WITH A MICRO-STRAIN GRADIENT IN ITS SURFACE LAYER

• 1. 浙江大学

Abstract: This paper deals with X-ray diffraction profile analysis for the sample with a micro-strain gradient in its surface layer. On the assumption that the variation of micro-strain L2> with depth t is expressed as L2>-Σam(L)tm, Warren-Averbach method is modified so that it can be used in this case. For the special case of L2>=α0+a1(L)t, the relationship between the micro-strain L2> and the depth t can be determined by analyses of diffraction profiles belonging to two different radiations.

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